Rigorous analysis of the spatial dispersion effect in multilayer thin-film coatings
JOSA A, Vol. 24, Issue 8, pp. 2328-2333 (2007)
http://dx.doi.org/10.1364/JOSAA.24.002328
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Abstract
We demonstrate a wavelength-dependent spatial lateral beam shift of a reflective Gaussian beam on the surface of multilayer thin-film coatings. Numerical analysis of the behavior of a Gaussian-form light beam incident on the surface of the coatings is performed. The theoretical analysis is for a two-dimensional light sheet. The spatial lateral beam dispersion can be determined rigorously from the numerical wave field in the region of the incident medium. The coatings present a spatial dispersion effect much larger than in previous reports. The thin-film coatings can act not only as positive spatial dispersion devices but in a proper case, also as negative spatial dispersion devices. As such, the devices produce a wavelength-dependent negative lateral shift of the reflective beam.
© 2007 Optical Society of America
OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(260.2110) Physical optics : Electromagnetic optics
(310.6860) Thin films : Thin films, optical properties
(350.3950) Other areas of optics : Micro-optics
ToC Category:
Thin Films
History
Original Manuscript: January 27, 2006
Revised Manuscript: November 22, 2006
Manuscript Accepted: March 6, 2007
Published: July 11, 2007
Citation
Mingyu Li, Xu Liu, Jinlong Zhang, Xin Ma, Xuezheng Sun, Yiyu Li, and Peifu Gu, "Rigorous analysis of the spatial dispersion effect in multilayer thin-film coatings," J. Opt. Soc. Am. A 24, 2328-2333 (2007)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-24-8-2328
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