## Synthetic incoherence for electron microscopy

JOSA A, Vol. 24, Issue 8, pp. 2402-2406 (2007)

http://dx.doi.org/10.1364/JOSAA.24.002402

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### Abstract

Tomographic studies of submicrometer samples in materials science using electron microscopy have been inhibited by diffraction effects. In the present work, we describe a practical method for ameliorating these effects. First, we find an analytic expression for the mutual coherence function for hollow-cone illumination. Then, we use this analytic expression to propose a Gaussian weighting of hollow-cone illumination, which we name tapered solid-cone illumination, and present an analytic expression for its mutual coherence function. Finally, we investigate numerically an *n*-ring approximation to tapered solid-cone illumination. The results suggest a method for removing diffraction effects and hence enabling tomography.

© 2007 Optical Society of America

**OCIS Codes**

(110.4980) Imaging systems : Partial coherence in imaging

(180.6900) Microscopy : Three-dimensional microscopy

**ToC Category:**

Microscopy

**History**

Original Manuscript: October 31, 2006

Manuscript Accepted: March 6, 2007

Published: July 11, 2007

**Virtual Issues**

Vol. 2, Iss. 9 *Virtual Journal for Biomedical Optics*

**Citation**

Zachary H. Levine and Robyn M. Dunstan, "Synthetic incoherence for electron microscopy," J. Opt. Soc. Am. A **24**, 2402-2406 (2007)

http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-24-8-2402

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