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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Editor: Stephen A. Burns
  • Vol. 24, Iss. 8 — Aug. 1, 2007
  • pp: 2402–2406

Synthetic incoherence for electron microscopy

Zachary H. Levine and Robyn M. Dunstan  »View Author Affiliations

JOSA A, Vol. 24, Issue 8, pp. 2402-2406 (2007)

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Tomographic studies of submicrometer samples in materials science using electron microscopy have been inhibited by diffraction effects. In the present work, we describe a practical method for ameliorating these effects. First, we find an analytic expression for the mutual coherence function for hollow-cone illumination. Then, we use this analytic expression to propose a Gaussian weighting of hollow-cone illumination, which we name tapered solid-cone illumination, and present an analytic expression for its mutual coherence function. Finally, we investigate numerically an n-ring approximation to tapered solid-cone illumination. The results suggest a method for removing diffraction effects and hence enabling tomography.

© 2007 Optical Society of America

OCIS Codes
(110.4980) Imaging systems : Partial coherence in imaging
(180.6900) Microscopy : Three-dimensional microscopy

ToC Category:

Original Manuscript: October 31, 2006
Manuscript Accepted: March 6, 2007
Published: July 11, 2007

Virtual Issues
Vol. 2, Iss. 9 Virtual Journal for Biomedical Optics

Zachary H. Levine and Robyn M. Dunstan, "Synthetic incoherence for electron microscopy," J. Opt. Soc. Am. A 24, 2402-2406 (2007)

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