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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Steven A. Burns
  • Vol. 24, Iss. 9 — Sep. 1, 2007
  • pp: 2578–2589

Derivatives of scattering profiles: tools for nanoparticle characterization

Richard Charnigo, Mathieu Francoeur, M. Pinar Mengüç, Audrey Brock, Matthew Leichter, and Cidambi Srinivasan  »View Author Affiliations


JOSA A, Vol. 24, Issue 9, pp. 2578-2589 (2007)
http://dx.doi.org/10.1364/JOSAA.24.002578


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Abstract

This paper presents a new approach to characterize nanoparticles using derivatives of scattering profiles of evanescent waves/surface plasmons. We start the procedure using the scattering profiles for an unknown configuration of nanoparticles, either from physical experiments or numerical simulations conducted for different nanoparticles on surfaces. We apply the statistical technique of compound estimation to recover the derivatives of scattering profiles. The L 1 discrepancies with the corresponding curves from known configurations are used to identify the most plausible configuration of particles that could yield the “experimental” profiles. We conduct a simulation study to see how often the new procedure correctly recovers the agglomeration level for gold spherical nanoparticles on a thin gold film. The results suggest that first derivatives are much more effective for characterization than undifferentiated profiles and that M 33 is the most useful element for distinguishing among configurations. The proposed compound estimation technique is more effective than typical inverse analyses based on look-up tables and can be used effectively in nanoparticle characterization platforms.

© 2007 Optical Society of America

OCIS Codes
(290.0290) Scattering : Scattering
(290.3200) Scattering : Inverse scattering

ToC Category:
Scattering

History
Original Manuscript: February 2, 2007
Revised Manuscript: April 11, 2007
Manuscript Accepted: April 12, 2007
Published: July 20, 2007

Citation
Richard Charnigo, Mathieu Francoeur, M. Pinar Mengüç, Audrey Brock, Matthew Leichter, and Cidambi Srinivasan, "Derivatives of scattering profiles: tools for nanoparticle characterization," J. Opt. Soc. Am. A 24, 2578-2589 (2007)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-24-9-2578

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