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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 25, Iss. 6 — Jun. 1, 2008
  • pp: 1240–1245

Retardation correction for photoelastic modulator-based multichannel reflectance difference spectroscopy

C. G. Hu, L. D. Sun, Y. N. Li, M. Hohage, J. M. Flores-Camacho, X. T. Hu, and P. Zeppenfeld  »View Author Affiliations


JOSA A, Vol. 25, Issue 6, pp. 1240-1245 (2008)
http://dx.doi.org/10.1364/JOSAA.25.001240


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Abstract

The wavelength dependence of the retardation induced by a photoelastic modulator (PEM) is a central issue in multichannel modulator-based spectroscopic ellipsometry and reflectance difference spectroscopy (RDS), where the optical signal is detected simultaneously at different wavelengths. Here we present a refined analysis of the modulator crystal’s retardation and its effect on the signal quality. Two retardation correction schemes that take into account the actual wavelength dependence of the stress-optic coefficient are introduced. It is demonstrated experimentally that both methods provide a better correction than the procedure currently used in multichannel RDS. We define quality factors to evaluate the actual performance of the multichannel detection system as compared with a wavelength adaptive single-channel experiment. These quality factors thus provide a useful guideline for choosing the appropriate PEM retardation or reference wavelength in a multichannel experiment.

© 2008 Optical Society of America

OCIS Codes
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(230.4110) Optical devices : Modulators
(240.5698) Optics at surfaces : Reflectance anisotropy spectroscopy
(240.6380) Optics at surfaces : Spectroscopy, modulation

ToC Category:
Optical Devices

History
Original Manuscript: October 29, 2007
Revised Manuscript: February 6, 2008
Manuscript Accepted: March 19, 2008
Published: May 7, 2008

Citation
C. G. Hu, L. D. Sun, Y. N. Li, M. Hohage, J. M. Flores-Camacho, X. T. Hu, and P. Zeppenfeld, "Retardation correction for photoelastic modulator-based multichannel reflectance difference spectroscopy," J. Opt. Soc. Am. A 25, 1240-1245 (2008)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-25-6-1240


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