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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 25, Iss. 6 — Jun. 1, 2008
  • pp: 1319–1329

Resolution in structured illumination microscopy: a probabilistic approach

Michael G. Somekh, Ken Hsu, and Mark C. Pitter  »View Author Affiliations


JOSA A, Vol. 25, Issue 6, pp. 1319-1329 (2008)
http://dx.doi.org/10.1364/JOSAA.25.001319


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Abstract

Structured illumination can be employed to extend the lateral resolution of wide-field fluorescence microscopy. Since a structured illumination microscopy image is reconstructed from a series of several acquired images, we develop a modified formulation of the imaging response of the microscope and a probabilistic analysis to assess the resolution performance. We use this model to compare the fluorescence imaging performance of structured illumination techniques to confocal microscopy. Specifically, we examine the trade-off between achievable lateral resolution and signal-to-noise ratio when photon shot noise is dominant. We conclude that for a given photon budget, structured illumination invariably achieves better lateral resolution than confocal microscopy.

© 2008 Optical Society of America

OCIS Codes
(000.5490) General : Probability theory, stochastic processes, and statistics
(030.4280) Coherence and statistical optics : Noise in imaging systems
(030.5290) Coherence and statistical optics : Photon statistics
(100.6640) Image processing : Superresolution
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:
Microscopy

History
Original Manuscript: November 15, 2007
Revised Manuscript: March 20, 2008
Manuscript Accepted: March 20, 2008
Published: May 15, 2008

Virtual Issues
Vol. 3, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Michael G. Somekh, Ken Hsu, and Mark C. Pitter, "Resolution in structured illumination microscopy: a probabilistic approach," J. Opt. Soc. Am. A 25, 1319-1329 (2008)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-25-6-1319

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