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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 25, Iss. 8 — Aug. 1, 2008
  • pp: 1843–1849

On the generalized Wertheim law in integrated photoelasticity

Leo Ainola and Hillar Aben  »View Author Affiliations


JOSA A, Vol. 25, Issue 8, pp. 1843-1849 (2008)
http://dx.doi.org/10.1364/JOSAA.25.001843


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Abstract

Two-dimensional photoelasticity is based on the classical Wertheim law. The integral Wertheim law can be used in integrated photoelasticity only in the case when the directions of the secondary principal stresses are constant on the light beam. We generalize the integral Wertheim law for the case when a slight rotation of the secondary principal directions takes place.

© 2008 Optical Society of America

OCIS Codes
(260.0260) Physical optics : Physical optics
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence
(260.2110) Physical optics : Electromagnetic optics

ToC Category:
Physical Optics

History
Original Manuscript: March 13, 2008
Revised Manuscript: May 13, 2008
Manuscript Accepted: May 19, 2008
Published: July 2, 2008

Citation
Leo Ainola and Hillar Aben, "On the generalized Wertheim law in integrated photoelasticity," J. Opt. Soc. Am. A 25, 1843-1849 (2008)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-25-8-1843


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References

  1. M. G. Wertheim, “Mémoire sur la double réfraction temporairement produite dans les corps isotropes, et sur la relation entre l'élasticité mécanique et entre l'élasticité optique,” Ann. Chim. Phys. 40, 156-221 (1854).
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  12. P. S. Theocaris and E. E. Gdoutos, Matrix Theory of Photoelasticity (Springer-Verlag, 1979).
  13. L. Ainola and H. Aben, “Principal formulas of integrated photoelasticity in terms of characteristic paramerters,” J. Opt. Soc. Am. A 22, 1181-1186 (2005). [CrossRef]
  14. A. Kuske, “Beiträge zur spannungsoptischen Untersuchung von Flächentragwerken,” Abh. Dtsch. Akad. Wiss. Berlin, Kl. Math., Phys., Techn. 4, 115-126 (1962).
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