Multilayered structures with high subwavelength resolution based on the metal-dielectric composites
JOSA A, Vol. 26, Issue 12, pp. 2521-2525 doi:10.1364/JOSAA.26.002521
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- OCIS Codes:
- (110.2990) Imaging systems : Image formation theory
- (160.4670) Materials : Optical materials
- (310.6860) Thin films : Thin films, optical properties
Thin Films
Citation
Xuan Li and Fei Zhuang, "Multilayered structures with high subwavelength resolution based on the metal-dielectric composites," J. Opt. Soc. Am. A 26, 2521-2525 (2009)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-26-12-2521
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Pure noble metals are usually considered to be negative-permittivity materials for multilayered structures. Such structures can produce flat equal-frequency contours and achieve subwavelength resolution by enabling all propagating and partial evanescent components of the source radiation to be transformed into propagating harmonics. We show that using a composite metal-dielectric layer with an appropriate metal filling factor instead of a negative-permittivity layer can facilitate operation at practically any desired wavelength and achieve good resolution (0.057λ) and that appropriate surface termination can improve the quality of imaging effectively.
© 2009 Optical Society of America
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History
Original Manuscript: March 3, 2009
Manuscript Accepted: October 2, 2009
Revised Manuscript: September 30, 2009
Published: November 5, 2009
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Hangzhou Normal University
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