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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 26, Iss. 2 — Feb. 1, 2009
  • pp: 337–341

Ray tracing of an aspherical lens with antireflective subwavelength structured surfaces

Akio Mizutani, Yu Kobayashi, Akira Maruyama, and Hisao Kikuta  »View Author Affiliations


JOSA A, Vol. 26, Issue 2, pp. 337-341 (2009)
http://dx.doi.org/10.1364/JOSAA.26.000337


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Abstract

A method of ray tracing for an aspherical lens with subwavelength periodic structured surfaces has been developed. The ray tracing in the antireflective subwavelength structure is based on the group velocity of the Bloch wave. Transmittance and phase delay for the surface structure are determined with rigorous coupled wave analysis. Calculated wavefront aberration was smaller than 20 m λ for an aspherical lens with numerical aperture of 0.6. For a lens with a higher numerical aperture, the wavefront aberrations increase drastically.

© 2009 Optical Society of America

OCIS Codes
(220.3620) Optical design and fabrication : Lens system design
(310.1210) Thin films : Antireflection coatings
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Diffraction and Gratings

History
Original Manuscript: June 18, 2008
Revised Manuscript: November 13, 2008
Manuscript Accepted: November 24, 2008
Published: January 28, 2009

Citation
Akio Mizutani, Yu Kobayashi, Akira Maruyama, and Hisao Kikuta, "Ray tracing of an aspherical lens with antireflective subwavelength structured surfaces," J. Opt. Soc. Am. A 26, 337-341 (2009)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-26-2-337

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