Abstract

We present details of a novel imaging algorithm based on the extended Nijboer–Zernike (ENZ) theory of diffraction. We derive integral expressions relating the electric field distribution in the entrance pupil of an optical system to the electric field in its focal region. The evaluation of these integrals is made possible by means of a highly accurate and efficient series expansion similar to those occurring in standard ENZ theory. Based on these results an ENZ imaging scheme is constructed and evaluated in detail with attention to the convergence properties and computational complexity of the new method.

© 2009 Optical Society of America

Assessment of an extended Nijboer–Zernike approach for the computation of optical point-spread functions

Joseph Braat, Peter Dirksen, and Augustus J. E. M. Janssen
J. Opt. Soc. Am. A 19(5) 858-870 (2002)

Extended Nijboer–Zernike approach for the computation of optical point-spread functions

Augustus J. E. M. Janssen
J. Opt. Soc. Am. A 19(5) 849-857 (2002)

Extended Nijboer–Zernike approach to aberration and birefringence retrieval in a high-numerical-aperture optical system

Joseph J.M. Braat, Peter Dirksen, Augustus J.E.M. Janssen, Sven van Haver, and Arthur S. van de Nes
J. Opt. Soc. Am. A 22(12) 2635-2650 (2005)

Extended Nijboer–Zernike representation of the vector field in the focal region of an aberrated high-aperture optical system

Joseph J. M. Braat, Peter Dirksen, Augustus J. E. M. Janssen, and Arthur S. van de Nes
J. Opt. Soc. Am. A 20(12) 2281-2292 (2003)

Demonstration of an optimised focal field with long focal depth and high transmission obtained with the Extended Nijboer-Zernike theory

A. P. Konijnenberg, L. Wei, N. Kumar, L. Couto Correa Pinto Filho, L. Cisotto, S. F. Pereira, and H. P. Urbach
Opt. Express 22(1) 311-324 (2014)