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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Editor: Franco Gori
  • Vol. 27, Iss. 2 — Feb. 1, 2010
  • pp: 245–250

Influence of multiple scattering on subwavelength imaging: transverse electric case

Xudong Chen and Yu Zhong  »View Author Affiliations

JOSA A, Vol. 27, Issue 2, pp. 245-250 (2010)

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This paper uses the Cramér–Rao bound (CRB) to investigate the role of multiple scattering in the framework of transverse electric (TE) electromagnetic inverse scattering. The surface mode in the TE scattering case enables a strong multiple scattering effect even if the scatterers are widely separated. We show that multiple scattering does not always improve the accuracy of the estimation, compared with that expected with a fictitious single scattering model. The reason for the aforementioned conclusion is discussed. Two scenarios that favor the multiple scattering effect are discussed, and the differences between these scenarios and the CRB analysis are highlighted.

© 2010 Optical Society of America

OCIS Codes
(180.6900) Microscopy : Three-dimensional microscopy
(290.3200) Scattering : Inverse scattering

ToC Category:

Original Manuscript: September 3, 2009
Revised Manuscript: December 11, 2009
Manuscript Accepted: December 13, 2009
Published: January 21, 2010

Xudong Chen and Yu Zhong, "Influence of multiple scattering on subwavelength imaging: transverse electric case," J. Opt. Soc. Am. A 27, 245-250 (2010)

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