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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Franco Gori
  • Vol. 27, Iss. 3 — Mar. 1, 2010
  • pp: 553–562

Gamma model and its analysis for phase measuring profilometry

Kai Liu, Yongchang Wang, Daniel L. Lau, Qi Hao, and Laurence G. Hassebrook  »View Author Affiliations


JOSA A, Vol. 27, Issue 3, pp. 553-562 (2010)
http://dx.doi.org/10.1364/JOSAA.27.000553


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Abstract

Phase measuring profilometry is a method of structured light illumination whose three-dimensional reconstructions are susceptible to error from nonunitary gamma in the associated optical devices. While the effects of this distortion diminish with an increasing number of employed phase-shifted patterns, gamma distortion may be unavoidable in real-time systems where the number of projected patterns is limited by the presence of target motion. A mathematical model is developed for predicting the effects of nonunitary gamma on phase measuring profilometry, while also introducing an accurate gamma calibration method and two strategies for minimizing gamma’s effect on phase determination. These phase correction strategies include phase corrections with and without gamma calibration. With the reduction in noise, for three-step phase measuring profilometry, analysis of the root mean squared error of the corrected phase will show a 60× reduction in phase error when the proposed gamma calibration is performed versus 33× reduction without calibration.

© 2010 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(150.5670) Machine vision : Range finding
(150.6910) Machine vision : Three-dimensional sensing
(150.0155) Machine vision : Machine vision optics
(150.1135) Machine vision : Algorithms

ToC Category:
Machine Vision

History
Original Manuscript: November 16, 2009
Manuscript Accepted: December 31, 2009
Published: February 25, 2010

Citation
Kai Liu, Yongchang Wang, Daniel L. Lau, Qi Hao, and Laurence G. Hassebrook, "Gamma model and its analysis for phase measuring profilometry," J. Opt. Soc. Am. A 27, 553-562 (2010)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-27-3-553


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