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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Franco Gori
  • Vol. 28, Iss. 11 — Nov. 1, 2011
  • pp: 2340–2345

Self-consistent optical constants of SiC thin films

Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, and José A. Méndez  »View Author Affiliations


JOSA A, Vol. 28, Issue 11, pp. 2340-2345 (2011)
http://dx.doi.org/10.1364/JOSAA.28.002340


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Abstract

The optical constants of ion-beam-sputtered SiC films have been measured by ellipsometry in the 190 to 950 nm range. The set of data has been extended both toward shorter and longer wavelengths with data in the literature, along with inter- and extrapolations, in order to obtain a self-consistent set of data by means of Kramers–Krönig analysis. All data correspond to films that were deposited by sputtering on nonheated substrates, and hence they are expected to be amorphous. A bandgap of 1.9 eV for the films was fitted from the obtained optical constants. A good global accuracy of the data was estimated through the use of various sum rules. The consistent dataset includes the visible to the extreme ultraviolet (EUV); this large spectrum of characterization will enable the design of multilayer coatings that combine a high reflectance in parts of the EUV with desired performance at a secondary range, such as the visible. To our knowledge, this paper provides the first compilation of the optical constants of amorphous SiC films.

© 2011 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(160.6000) Materials : Semiconductor materials
(230.4170) Optical devices : Multilayers
(260.7200) Physical optics : Ultraviolet, extreme
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 17, 2011
Revised Manuscript: September 22, 2011
Manuscript Accepted: September 27, 2011
Published: October 26, 2011

Citation
Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, and José A. Méndez, "Self-consistent optical constants of SiC thin films," J. Opt. Soc. Am. A 28, 2340-2345 (2011)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-28-11-2340

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