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Minimizing light reflection from dielectric textured surfaces |
JOSA A, Vol. 28, Issue 5, pp. 770-777 (2011)
http://dx.doi.org/10.1364/JOSAA.28.000770
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Abstract
In this paper, we consider antireflective properties of textured surfaces for all texture size-to-wavelength ratios. Existence and location of the global reflection minimum with respect to geometrical parameters of the texture is a subject of our study. We also investigate asymptotic behavior of the reflection with the change of the texture geometry for the long and short wavelength limits. As a particular example, we consider silicon-textured surfaces used in solar cells technology. Most of our results are obtained with the help of the finite-difference time-domain (FDTD) method. We also use effective medium theory and geometric optics approximation for the limiting cases. The FDTD results for these limits are in agreement with the corresponding approximations.
© 2011 Optical Society of America
OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(310.1210) Thin films : Antireflection coatings
ToC Category:
Thin Films
History
Original Manuscript: January 4, 2011
Revised Manuscript: February 11, 2011
Manuscript Accepted: February 15, 2011
Published: April 12, 2011
Citation
Alexei Deinega, Ilya Valuev, Boris Potapkin, and Yurii Lozovik, "Minimizing light reflection from dielectric textured surfaces," J. Opt. Soc. Am. A 28, 770-777 (2011)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-28-5-770
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