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How low can STED go? Comparison of different write-erase beam combinations for stimulated emission depletion microscopy |
JOSA A, Vol. 29, Issue 10, pp. 2242-2246 (2012)
http://dx.doi.org/10.1364/JOSAA.29.002242
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Abstract
We compare different beam combinations for stimulated emission depletion
microscopy. The four considered copolarized, mutually symmetric, but
complementary write
© 2012 Optical Society of America
OCIS Codes
(100.6640) Image processing : Superresolution
(180.0180) Microscopy : Microscopy
(210.0210) Optical data storage : Optical data storage
(230.0230) Optical devices : Optical devices
(260.0260) Physical optics : Physical optics
(260.5430) Physical optics : Polarization
ToC Category:
Microscopy
History
Original Manuscript: July 3, 2012
Revised Manuscript: September 11, 2012
Manuscript Accepted: September 11, 2012
Published: September 28, 2012
Citation
Svetlana N. Khonina and Ilya Golub, "How low can STED go? Comparison of different write-erase beam combinations for stimulated emission depletion microscopy," J. Opt. Soc. Am. A 29, 2242-2246 (2012)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-29-10-2242
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