A novel approach for the simulation of the field back-scattered from a rough surface is presented. It takes into account polarization and multiple scattering events on the surface, as well as diffraction effects. The validity and usefulness of this simulation is demonstrated in the case of surface topology measurement.
© 2012 Optical Society of America
Coherence and Statistical Optics
Original Manuscript: July 29, 2011
Revised Manuscript: November 23, 2011
Manuscript Accepted: November 25, 2011
Published: February 14, 2012
Yves Delacrétaz, Olivier Seydoux, Stéphane Chamot, Andreas Ettemeyer, and Christian Depeursinge, "Monte Carlo simulation of the field back-scattered from rough surfaces," J. Opt. Soc. Am. A 29, 270-277 (2012)