Abstract
For a random phase diffuser (RPD), the probability-density function of the surface roughness is found that minimizes rms roughness under the condition that scattered radiation does not contain a specular component. This function is found to be discrete and is obeyed by binary diffusers that introduce to the incident radiation two phase shifts, π/2 and −π/2. For an RPD that is assumed to be fabricated by a photographic method and whose phase obeys the continuous density function, which closely approximates the above discrete distribution, a general form of the autocorrelation of amplitude transmittance is calculated. The present study shows that strong scattering can be performed by surfaces whose rms roughness equals only λ/4 when reflecting geometry is assumed and when λ is a wavelength of incident radiation.
© 1986 Optical Society of America
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Marek Kowalczyk
J. Opt. Soc. Am. A 1(2) 192-200 (1984)
Bruce Martin Levine
J. Opt. Soc. Am. A 3(8) 1283-1292 (1986)
Junji Ohtsubo
J. Opt. Soc. Am. A 3(7) 982-987 (1986)