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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Editor: Franco Gori
  • Vol. 30, Iss. 10 — Oct. 1, 2013
  • pp: 2133–2139

High-resolution tomographic diffractive microscopy in reflection configuration

Guillaume Maire, Yi Ruan, Ting Zhang, Patrick C. Chaumet, Hugues Giovannini, Daniel Sentenac, Anne Talneau, Kamal Belkebir, and Anne Sentenac  »View Author Affiliations

JOSA A, Vol. 30, Issue 10, pp. 2133-2139 (2013)

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Tomographic diffractive microscopy (TDM) is a label-free imaging technique that reconstructs the 3D refractive index map of the probed object with an improved resolution compared to confocal microscopy. In this work, we consider a TDM implementation in which the sample is deposited on a reflective substrate. We show that this configuration requires calibration and inversion procedures that account for the presence of the substrate for getting highly resolved quantitative reconstructions.

© 2013 Optical Society of America

OCIS Codes
(180.6900) Microscopy : Three-dimensional microscopy
(110.1758) Imaging systems : Computational imaging
(110.6955) Imaging systems : Tomographic imaging
(110.3200) Imaging systems : Inverse scattering

ToC Category:
Imaging Systems

Original Manuscript: August 1, 2013
Revised Manuscript: September 3, 2013
Manuscript Accepted: September 3, 2013
Published: September 30, 2013

Guillaume Maire, Yi Ruan, Ting Zhang, Patrick C. Chaumet, Hugues Giovannini, Daniel Sentenac, Anne Talneau, Kamal Belkebir, and Anne Sentenac, "High-resolution tomographic diffractive microscopy in reflection configuration," J. Opt. Soc. Am. A 30, 2133-2139 (2013)

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