Abstract
Tomographic diffractive microscopy (TDM) is a label-free imaging technique that reconstructs the 3D refractive index map of the probed object with an improved resolution compared to confocal microscopy. In this work, we consider a TDM implementation in which the sample is deposited on a reflective substrate. We show that this configuration requires calibration and inversion procedures that account for the presence of the substrate for getting highly resolved quantitative reconstructions.
© 2013 Optical Society of America
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