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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Franco Gori
  • Vol. 30, Iss. 11 — Nov. 1, 2013
  • pp: 2416–2421

Determination of the rough interface parameters using the self-imaging effect

Masoomeh Dashtdar and S. Mohammad Ali Hosseini Saber  »View Author Affiliations


JOSA A, Vol. 30, Issue 11, pp. 2416-2421 (2013)
http://dx.doi.org/10.1364/JOSAA.30.002416


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Abstract

In this work, a linear grating is used to project a periodic light intensity distribution on a rough interface, and the near field transmitted light scattering is studied. It is shown theoretically that the intensity in the Fresnel regime depends on statistical properties of the rough interface and the light intensity period. The self-image contrast exponentially depends on the interface height–height correlation function. The correlation is obtained in terms of multiplication of the self-image number and the period of the light intensity distribution. Therefore, the roughness and the correlation length of the interface can be obtained by determining the contrast of the self-images when the light intensity period is smaller than the interface correlation length. For periods longer than twice the correlation length, the contrast measurements only provide the interface roughness. In experimental studies, the roughness of interfaces is determined by square gratings with periods much longer than the correlation lengths. The rough interfaces are prepared by roughening sheet glass by powders of different grit numbers. The results for different gratings and light wavelengths are quite consistent.

© 2013 Optical Society of America

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(050.1940) Diffraction and gratings : Diffraction
(070.6760) Fourier optics and signal processing : Talbot and self-imaging effects
(290.5880) Scattering : Scattering, rough surfaces

ToC Category:
Diffraction and Gratings

History
Original Manuscript: August 26, 2013
Revised Manuscript: October 6, 2013
Manuscript Accepted: October 7, 2013
Published: October 29, 2013

Citation
Masoomeh Dashtdar and S. Mohammad Ali Hosseini Saber, "Determination of the rough interface parameters using the self-imaging effect," J. Opt. Soc. Am. A 30, 2416-2421 (2013)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-30-11-2416


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References

  1. K. H. Guenther, P. G. Wierer, and J. M. Bennett, “Surface roughness measurements of low-scatter mirrors and roughness standards,” Appl. Opt. 23, 3820–3836 (1984). [CrossRef]
  2. C. Amra, “From light scattering to the microstructure of thin-film multilayers,” Appl. Opt. 32, 5481–5491 (1993). [CrossRef]
  3. D. J. Whitehouse, “Review article: surface metrology,” Meas. Sci. Technol. 8, 955–972 (1997). [CrossRef]
  4. J. M. Bennett, “Measurement of the rms roughness, autocovariance and other statistical properties of optical surfaces using a FECO scanning interferometer,” Appl. Opt. 15, 2705–2721 (1976). [CrossRef]
  5. K. A. O’Donnell, “Effect of finite stylus width in surface contact profilomery,” Appl. Opt. 32, 4922–4928 (1993). [CrossRef]
  6. Y. Fainman, E. Lenz, and J. Shamir, “Optical profilometer: a new method for high sensitivity and wide dynamic range,” Appl. Opt. 21, 3200–3208 (1982). [CrossRef]
  7. O. V. Angelsky and P. P. Maksimyak, “Optical diagnostics of random phase objects,” Appl. Opt. 29, 2894–2898 (1990). [CrossRef]
  8. O. V. Angelsky, P. P. Maksimyak, V. V. Ryukhtin, and S. G. Hanson, “New feasibilities for characterizing rough surfaces by optical-correlation techniques,” Appl. Opt. 40, 5693–5707 (2001). [CrossRef]
  9. O. V. Angelsky, D. N. Burkovets, P. P. Maksimyak, and S. G. Hanson, “Applicability of the singular-optics concept for diagnostics of random and fractal rough surfaces,” Appl. Opt. 42, 4529–4540 (2003). [CrossRef]
  10. W. T. Welford, “Optical estimation of statistics of surface roughness from light scattering measurements,” Opt. Quantum Electron. 9, 269–287 (1977). [CrossRef]
  11. M. Dashtdar and M. T. Tavassoly, “Roughness measurement using threshold angle of image formation,” Opt. Eng. 50, 123601 (2011). [CrossRef]
  12. P. Gonzalez-Rodriguez and A. D. Kim, “Light propagation in two-layer tissue with an irregular interface,” J. Opt. Soc. Am. A 25, 64–73 (2008). [CrossRef]
  13. Y. Oh, K. Sarabandi, and F. T. Ulaby, “An empirical model and an inversion technique for radar scattering from bare soil surfaces,” IEEE Trans. Geosci. Remote Sens. 30, 370–381 (1992). [CrossRef]
  14. M. Dashtdar and M. T. Tavassoly, “Redshift and blueshift in the spectra of lights coherently and diffusely scattered from random rough interfaces,” J. Opt. Soc. Am. A 26, 2134–2138 (2009). [CrossRef]
  15. P. Beckman and A. Spizzochino, The Scattering of Electromagnetic Waves from Rough Surfaces (Macmillan, 1963).
  16. J. A. Ogilvy, Theory of Wave Scattering from Random Rough Surfaces (Adam Hilger, 1991).
  17. M. Nieto-Vesperinas, “Depolarization of electromagnetic waves scattered from slightly rough random surfaces: a study by means of the extinction theorem,” J. Opt. Soc. Am. 72, 539–574 (1982). [CrossRef]
  18. T. M. Elfouhaily and C. A. Guerin, “A critical survey of approximate scattering wave theories from random rough surfaces,” Waves Random Media 14, R1–R40 (2004). [CrossRef]
  19. A. Krywonos, J. E. Harvey, and N. Choi, “Linear systems formulation of scattering theory for rough surfaces with arbitrary incident and scattering angles,” J. Opt. Soc. Am. A 28, 1121–1138 (2011). [CrossRef]
  20. M. Nieto-Vesperinas, J. A. Sanchez-Gil, A. J. Sant, and J. C. Dainty, “Light transmission from a randomly rough dielectric diffuser: theoretical and experimental results,” Opt. Lett. 15, 1261–1263 (1990). [CrossRef]
  21. J. A. Sanchez-Gil and M. Nieto-Vesperinas, “Light scattering from random rough dielectric surfaces,” J. Opt. Soc. Am. A 8, 1270–1286 (1991). [CrossRef]
  22. A. Dogariu and G. D. Boreman, “Facet model for photon-flux transmission through rough dielectric interface,” Opt. Lett. 21, 701–703 (1996). [CrossRef]
  23. I. Sassi and M. S. Sifaoui, “Comparison of geometric optics approximation and integral method for reflection and transmission from microgeometrical dielectric surfaces,” J. Opt. Soc. Am. A 24, 451–462 (2007). [CrossRef]
  24. K. F. Warnick and W. C. Chew, “Numerical simulation methods for rough surface scattering,” Waves Random Media 11, R1–R30 (2001). [CrossRef]
  25. H. E. Bennett and J. O. Porteus, “Relation between surface roughness and specular reflectance at normal incidence,” J. Opt. Soc. Am. 51, 123–129 (1961). [CrossRef]
  26. P. J. Chandley, “Surface roughness measurements from coherent light scattering,” Opt. Quantum Electron. 8, 323–327 (1976). [CrossRef]
  27. K. A. O’Donnell and E. R. Mendez, “Experimental study of scattering from characterized random surfaces,” J. Opt. Soc. Am. A 4, 1194–1205 (1987). [CrossRef]
  28. E. Marx and T. V. Vorburger, “Direct and inverse problems for light scattered by rough surfaces,” Appl. Opt. 29, 3613–3626 (1990). [CrossRef]
  29. S.-M. F. Nee, R. V. Dewees, T.-W. Nee, L. F. Johnson, and M. B. Moran, “Slope distribution of a rough surface measured by transmission scattering and polarization,” Appl. Opt. 39, 1561–1569 (2000). [CrossRef]
  30. M. T. Tavassoly and M. Dashtdar, “Height distribution on a rough plane and specularly diffracted light amplitude are Fourier transform pair,” Opt. Commun. 281, 2397–2405 (2008). [CrossRef]
  31. M. Dashtdar and M. T. Tavassoly, “Determination of height distribution on a rough interface by measuring the coherently transmitted or reflected light intensity,” J. Opt. Soc. Am. A 25, 2509–2517 (2008). [CrossRef]
  32. M. Born and E. Wolf, Principles of Optics (Cambridge University, 2002), pp. 421–430.
  33. Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Characterization of Amorphous and Crystalline Rough Surface—Principles and Applications Vol. 37 of Experimental Methods in the Physical Sciences (Academic, 2001), pp. 133–156.

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