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Superresolution with full-polarized tomographic diffractive microscopy

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Abstract

Tomographic diffractive microscopy is a three-dimensional imaging technique that reconstructs the permittivity map of the probed sample from its scattered field, measured both in phase and in amplitude. Here, we detail how polarization-resolved measurements permit us to significantly improve the accuracy and the resolution of the reconstructions, compared to the conventional scalar treatments used so far. An isotropic transverse resolution of about 100 nm at a wavelength of 475 nm is demonstrated using this approach.

© 2015 Optical Society of America

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