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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 4, Iss. 4 — Apr. 1, 1987
  • pp: 655–663

Beam phenomena at and near critical incidence upon a dielectric interface

C. Chiu Chan and T. Tamir  »View Author Affiliations

JOSA A, Vol. 4, Issue 4, pp. 655-663 (1987)

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Nonspecular phenomena involving Gaussian beams reflected at a dielectric interface include the well-known lateral displacement, the more recently investigated focal and angular shifts, and a fourth newly recognized effect termed beam-waist modification. In the past, expressions for the magnitudes of these effects have been obtained for incidence angles θi that are not too close to the critical angle of total reflection θc, but results for θi near θc have been reported only for lateral displacement. We have therefore examined all the four effects and derived explicit expressions that hold for arbitrary values of θi in the vicinity of θc. These expressions are consistent with the results obtained by others for θiθc as well as with those for the lateral displacement around θi= θc. We find that the nonspecular effects are finite at θc, and we include a set of universal curves to clarify the behavior and interrelations of these phenomena.

© 1987 Optical Society of America

Original Manuscript: June 23, 1986
Manuscript Accepted: December 8, 1986
Published: April 1, 1987

C. Chiu Chan and T. Tamir, "Beam phenomena at and near critical incidence upon a dielectric interface," J. Opt. Soc. Am. A 4, 655-663 (1987)

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  1. H. K. V. Lotsch, “Beam displacement at total reflection: the Goos–Hänchen effect,” Optik 32, 116–137, 189–204 (1970); Optik 32, 299–319, 553–569 (1971).
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  9. Note that ui here plays the same role as (−δ)1/2in Ref. 2.
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