OSA's Digital Library

Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 9, Iss. 11 — Nov. 1, 1992
  • pp: 2000–2008

Electronic speckle contouring

R. Rodríguez-Vera, D. Kerr, and F. Mendoza-Santoyo  »View Author Affiliations

JOSA A, Vol. 9, Issue 11, pp. 2000-2008 (1992)

View Full Text Article

Enhanced HTML    Acrobat PDF (1227 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Electronic speckle contouring is concerned with shape measurement by using fringe-projection techniques in electronic speckle pattern interferometry (ESPI). Conventional in-plane and out-of-plane displacement-sensitive ESPI instrumentation may be used for contouring without any alterations to the optical hardware. The contour maps of three-dimensional diffuse objects are obtained by small shifts of optical fibers carrying the object-illumination and reference beams. It is theoretically demonstrated and experimentally verified that the fringe patterns produced are identical to projected fringe contours and may be analyzed in the usual way. Phase measurement and digital image processing are used for data reduction.

© 1992 Optical Society of America

Original Manuscript: February 11, 1992
Revised Manuscript: May 29, 1992
Manuscript Accepted: June 1, 1992
Published: November 1, 1992

R. Rodríguez-Vera, D. Kerr, and F. Mendoza-Santoyo, "Electronic speckle contouring," J. Opt. Soc. Am. A 9, 2000-2008 (1992)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. B. D. Berquist, P. Montgomery, “Contouring by electronic speckle pattern interferometry (ESPI),” in Optics in Engineering Measurement, W. F. Fagan, ed., Proc. Soc. Photo-Opt. Instrum. Eng.599, 189–195 (1985). [CrossRef]
  2. D. Kerr, R. Rodríquez-Vera, F. Mendoza-Santoyo, “Surface contouring using electronic speckle pattern interferometry,” in Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics, Fu-Pen Chiang, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1554A, 668–679 (1991).
  3. P. C. Montgomery, “Forward looking innovations in electronic speckle pattern interferometry,” Ph.D. dissertation (Loughborough University of Technology, Loughborough, England, 1987).
  4. S. Winther, G. A. Slettemoen, “An ESPI contouring technique in strain analysis,” in Symposium Optika ’84 (Budapest), G. Lupkoviks, A. Podmaniczky, eds., Proc. Soc. Photo-Opt. Instrum. Eng.473, 44–47 (1984). [CrossRef]
  5. A. R. Ganesan, R. S. Sirohi, “New method of contouring using digital speckle pattern interferometry (DSPI),” in Optical Testing and Metrology II, C. P. Grover, ed., Proc. Soc. Photo-Opt. Instrum. Eng.954, 327–332 (1988). [CrossRef]
  6. C. Joenathan, B. Pfister, H. J. Tiziani, “Contouring by electronic speckle pattern interferometry employing dual beam illumination,” Appl. Opt. 29, 1905–1911 (1990). [CrossRef] [PubMed]
  7. G. T. Reid, R. C. Rixon, H. I. Messer, “Absolute and comparative measurements of three dimensional shape by phase measuring moiré topography,” Opt. Lasers Tech. 16, 315–319 (1984). [CrossRef]
  8. K. J. Gasvik, “Moiré technique by means of digital image processing,” Appl. Opt. 22, 3543–3548 (1983). [CrossRef] [PubMed]
  9. J. D. Hovanesian, Y. Y. Hung, “Moiré contour-sum contour-difference, and vibration analysis of arbitrary objects,” Appl. Opt. 10, 2734–2738 (1971). [CrossRef] [PubMed]
  10. K. Creath, “Phase-shifting speckle interferometry,” Appl. Opt. 24, 3053–3058 (1985). [CrossRef] [PubMed]
  11. D. Robinson, D. Williams, “Digital phase stepping speckle interferometry,” Opt. Commun. 57, 26–30 (1986). [CrossRef]
  12. D. Kerr, F. Mendoza Santoyo, J. R. Tyrer, “Extraction of phase data from electronic speckle pattern interferometric fringes using a single-phase-step method: a novel approach,” J. Opt. Soc. Am. A 7, 820–826 (1990). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited