Transverse superresolution technique involving rectified Laguerre–Gaussian LG⁰_p beams

• Abstract

• JOSA A, Vol. 28, Issue 8, pp. 1709-1715 (August 2011)
• Emmanuel Cagniot, Michael Fromager, Thomas Godin, Nicolas Passilly, Kamel Aït-Ameur

Single shot phase contrast imaging using laser-produced Betatron x-ray beams

• Abstract

• Optics Letters, Vol. 36, Issue 13, pp. 2426-2428 (July 2011)
• S. Fourmaux, S. Corde, K. Ta Phuoc, P. Lassonde, G. Lebrun, S. Payeur, F. Martin, S. Sebban, V. Malka, A. Rousse, J. C. Kieffer

Enhancement of the broadband modulation diffraction efficiency of liquid-crystal displays

• Abstract

• Optics Letters, Vol. 37, Issue 1, pp. 52-54 (January 2012)
• Jorge Albero, Ignacio Moreno, Juan Campos

Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection

• Abstract

• Optics Letters, Vol. 37, Issue 2, pp. 160-162 (January 2012)
• A. J. R. van den Boogaard, F. A. van Goor, E. Louis, F. Bijkerk

Longitudinal-differential interferometry: direct imaging of axial superluminal phase propagation

• Abstract

• Optics Letters, Vol. 37, Issue 3, pp. 305-307 (February 2012)
• Myun-Sik Kim, Toralf Scharf, Christoph Etrich, Carsten Rockstuhl, Hans Herzig Peter

Polarization independent broadband reflectors based on cross-stacked gratings

• Abstract
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• Optics Express, Vol. 19, Issue 10, pp. 9050-9055 (May 2011)
• Deyin Zhao, Hongjun Yang, Zhenqiang Ma, Weidong Zhou

Design of phase-shifted hybrid silicon distributed feedback lasers

• Abstract
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• Optics Express, Vol. 19, Issue 10, pp. 9255-9261 (May 2011)
• Sudharsanan Srinivasan, Alexander W. Fang, Di Liang, Jon Peters, Bryan Kaye, John E. Bowers

Improving resolution of superlens lithography by phase-shifting mask

• Abstract
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• Optics Express, Vol. 19, Issue 17, pp. 15982-15989 (August 2011)
• Na Yao, Zian Lai, Liang Fang, Changtao Wang, Qin Feng, Zheyu Zhao, Xiangang Luo

Quantitative single-exposure x-ray phase contrast imaging using a single attenuation grid

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19781-19789 (September 2011)
• Kaye S. Morgan, David M. Paganin, Karen K. W. Siu

Fringe projection profilometry based on a novel phase shift method

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21739-21747 (October 2011)
• Yanjun Fu, Qian Luo

Noninterferometric phase-contrast images obtained with incoherent x-ray sources

• Abstract

• Applied Optics, Vol. 50, Issue 12, pp. 1765-1769 (April 2011)
• Alessandro Olivo, Konstantin Ignatyev, Peter R. T. Munro, Robert D. Speller

Application of sampling criterion on numerical diffraction from bacterial colonies

• Abstract

• Applied Optics, Vol. 50, Issue 15, pp. 2228-2238 (May 2011)
• Euiwon Bae, Nan Bai, E. Daniel Hirleman

Arbitrary phasing technique for two-dimensional coherent laser array based on an active segmented mirror

• Abstract

• Applied Optics, Vol. 50, Issue 15, pp. 2239-2245 (May 2011)
• Yi Zheng, Xiaohua Wang, Li Deng, Feng Shen, Xinyang Li

Design of a vector-sum integrated microwave photonic phase shifter in silicon-on-insulator waveguides

• Abstract

• Applied Optics, Vol. 50, Issue 17, pp. 2523-2530 (June 2011)
• Pengfei Qu, Caixia Liu, Wei Dong, Weiyou Chen, Fumin Li, Haibin Li, Zhaoxin Gong, Shengping Ruan, Xindong Zhang, Jingran Zhou

Method for designing phase-calculation algorithms for two-dimensional grating phase-shifting interferometry

• Abstract

• Applied Optics, Vol. 50, Issue 18, pp. 2815-2822 (June 2011)
• Yucong Zhu, Satoru Odate, Ayako Sugaya, Katsura Otaki, Katsumi Sugisaki, Chiaki Koike, Tetsuya Koike, Kiyoshi Uchikawa

Implementation of phase-shift patterns using a holographic projection system with phase-only diffractive optical elements

• Abstract

• Applied Optics, Vol. 50, Issue 20, pp. 3646-3652 (July 2011)
• Wei-Feng Hsu, Yu-Wen Chen, Yuan-Hong Su

Modulation transfer function for infrared reflectarrays

• Abstract

• Applied Optics, Vol. 50, Issue 27, pp. 5344-5350 (September 2011)
• Jose Antonio Gómez-Pedrero, James Ginn, Javier Alda, Glenn Boreman

Optimal 3D phase-shifting masks in partially coherent illumination

• Abstract

• Applied Optics, Vol. 50, Issue 28, pp. 5567-5576 (October 2011)
• Xu Ma, Gonzalo R. Arce, Yanqiu Li

Wavelength dispersion measurement of electro-optic coefficients in the range of 520 to 930 nm in rubidium titanyl phosphate using spectral interferometry

• Abstract

• Applied Optics, Vol. 51, Issue 5, pp. 594-599 (February 2012)
• Olivier Gobert, Nikita Fedorov, Gabriel Mennerat, Dominique Lupinski, Delphine Guillaumet, Michel Perdrix, Antoine Bourgeade, Michel Comte

Dependence of wavefront errors on nonuniformity of thin films

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 1, pp. 013104- (January 2012)
• Hongji Qi, Meiping Zhu, Weili Zhang, Kui Yi, Hongbo He, Jianda Shao