Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology

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Development of a combined pure rotational and vibrational coherent anti-Stokes Raman scattering system

• Abstract

• Optics Letters, Vol. 38, Issue 8, pp. 1340-1342 (April 2013)
• Aman Satija, Robert P. Lucht

Collecting optical coherence elastography depth profiles with a micromachined cantilever probe

• Abstract

• Optics Letters, Vol. 38, Issue 9, pp. 1476-1478 (May 2013)
• Dhwajal Chavan, Jianhua Mo, Mattijs de Groot, Anna Meijering, Johannes F. de Boer, Davide Iannuzzi

Quantitative, three-dimensional diagnostics of multiphase drop fragmentation via digital in-line holography

• Abstract

• Optics Letters, Vol. 38, Issue 11, pp. 1893-1895 (June 2013)
• Jian Gao, Daniel R. Guildenbecher, Phillip L. Reu, Varun Kulkarni, Paul E. Sojka, Jun Chen

Pulse-to-pulse alignment technique based on synthetic-wavelength interferometry of optical frequency combs for distance measurement

• Abstract

• Optics Letters, Vol. 38, Issue 12, pp. 2140-2143 (June 2013)
• Guanhao Wu, Mayumi Takahashi, Hajime Inaba, Kaoru Minoshima

Quantitative plasmonic measurements using embedded phase stepping confocal interferometry

• Abstract
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• Optics Express, Vol. 21, Issue 9, pp. 11523-11535 (May 2013)
• Bei Zhang, Suejit Pechprasarn, Michael G. Somekh

Accurate holographic imaging of colloidal particle pairs by Rayleigh-Sommerfeld reconstruction

• Abstract
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• Optics Express, Vol. 21, Issue 10, pp. 12228-12237 (May 2013)
• David Kapfenberger, Adar Sonn-Segev, Yael Roichman

Heterodyne common-path grating interferometer with Littrow configuration

• Abstract
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• Optics Express, Vol. 21, Issue 11, pp. 13322-13332 (June 2013)
• Chyan-Chyi Wu, Cheng-Chih Hsu, Ju-Yi Lee, Yan-Zou Chen

Compressible fiber optic micro-Fabry-Pérot cavity with ultra-high pressure sensitivity

• Abstract
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• Optics Express, Vol. 21, Issue 12, pp. 14084-14089 (June 2013)
• Ying Wang, D. N. Wang, Chao Wang, Tianyi Hu

Super-resolution imaging using proximity projection grating and structured light illumination

• Abstract
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• Optics Express, Vol. 21, Issue 13, pp. 15155-15167 (July 2013)
• Chung W. See, Feng Hu, Chin-Jung Chuang, Michael G. Somekh

Coherent two-beam interference fringe projection for highspeed three-dimensional shape measurements

• Abstract
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• Applied Optics, Vol. 52, Issue 11, pp. 2306-2311 (April 2013)
• Martin Schaffer, Marcus Große, Bastian Harendt, Richard Kowarschik

Dynamic symmetrical pattern projection based laser triangulation sensor for precise surface position measurement of various material types

• Abstract

• Applied Optics, Vol. 52, Issue 12, pp. 2750-2760 (April 2013)
• Klemen Žbontar, Matjaž Mihelj, Boštjan Podobnik, Franc Povše, Marko Munih

Low-cost scheme for high-precision dual-wavelength laser metrology

• Abstract

• Applied Optics, Vol. 52, Issue 12, pp. 2808-2814 (April 2013)
• Yitping Kok, Michael J. Ireland, J. Gordon Robertson, Peter G. Tuthill, Benjamin A. Warrington, William J. Tango

Measurement of the liquid crystal pretilt angle in cells with homogeneous and inhomogeneous liquid crystal director configuration

• Abstract

• Applied Optics, Vol. 52, Issue 13, pp. 3012-3019 (May 2013)
• Victor V. Belyaev, Alexey S. Solomatin, Denis N. Chausov

Displacement sensor for indoor machine calibrations

• Abstract

• Applied Optics, Vol. 52, Issue 15, pp. 3461-3472 (May 2013)
• Asloob Ahmad Mudassar, Saira Butt

Binary coded triangular fringes for 3-D surface-shape measurement

• Abstract

• Applied Optics, Vol. 52, Issue 15, pp. 3576-3582 (May 2013)
• Jorge L. Flores, García Torales, José A. Ferrari, Gastón Ayubi, Oscar Ed. Castillo, Matías Di Martino

Refractive index measurement by fiber point diffraction longitudinal shearing interferometry

• Abstract

• Applied Optics, Vol. 52, Issue 16, pp. 3655-3661 (June 2013)
• Lingfeng Chen, Xiaofei Guo, Jinjian Hao

Coherence scanning interferometry: linear theory of surface measurement

• Abstract

• Applied Optics, Vol. 52, Issue 16, pp. 3662-3670 (June 2013)
• Jeremy Coupland, Rahul Mandal, Kanik Palodhi, Richard Leach

Measuring the lens focal length by laser reflection-confocal technology

• Abstract

• Applied Optics, Vol. 52, Issue 16, pp. 3812-3817 (June 2013)
• Jiamiao Yang, Lirong Qiu, Weiqian Zhao, Rongjun Shao, Zhigang Li

Wedge-plate shear for focus-shifting testing in single-shot laser system

• Abstract

• Applied Optics, Vol. 52, Issue 18, pp. 4237-4241 (June 2013)
• Juanning Zhao, Xiaona Dong, Limin Gao, Hongguang Li

Inspection of freeform intraocular lens topography by phase measuring deflectometric methods

• Abstract

• Applied Optics, Vol. 52, Issue 18, pp. 4279-4286 (June 2013)
• Alexis Speck, Benedikt Zelzer, Marc Kannengießer, Achim Langenbucher, Timo Eppig

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