Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer

• Abstract

• JOSA A, Vol. 30, Issue 7, pp. 1310-1319 (July 2013)
• Won Chegal, Jeong Pyo Lee, Hyun Mo Cho, Sang-Wook Han, Yong Jai Cho

Fiber-based multiple-access ultrastable frequency dissemination

• Abstract

• Optics Letters, Vol. 37, Issue 22, pp. 4690-4692 (November 2012)
• C. Gao, B. Wang, W. L. Chen, Y. Bai, J. Miao, X. Zhu, T. C. Li, L. J. Wang

Carbon nanotube electrical-substitution cryogenic radiometer: initial results

• Abstract

• Optics Letters, Vol. 38, Issue 2, pp. 175-177 (January 2013)
• N. A. Tomlin, J. H. Lehman

Ultrasensitive real-time measurement of dissipation and dispersion in a whispering-gallery mode microresonator

• Abstract

• Optics Letters, Vol. 38, Issue 11, pp. 1915-1917 (June 2013)
• Joachim Knittel, Jong H. Chow, Malcolm B. Gray, Michael A. Taylor, Warwick P. Bowen

Optical feedback stabilized laser tuned by single-sideband modulation

• Abstract

• Optics Letters, Vol. 38, Issue 12, pp. 2062-2064 (June 2013)
• Johannes Burkart, Daniele Romanini, Samir Kassi

Pulse-to-pulse alignment technique based on synthetic-wavelength interferometry of optical frequency combs for distance measurement

• Abstract

• Optics Letters, Vol. 38, Issue 12, pp. 2140-2143 (June 2013)
• Guanhao Wu, Mayumi Takahashi, Hajime Inaba, Kaoru Minoshima

Dynamic optical sampling by cavity tuning and its application in lidar

• Abstract
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• Optics Express, Vol. 21, Issue 3, pp. 3850-3860 (February 2013)
• Lin Yang, Jinsong Nie, Lingze Duan

On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors

• Abstract
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• Optics Express, Vol. 21, Issue 4, pp. 4291-4302 (February 2013)
• Anton Kachatkou, Roelof van Silfhout

Metrological characterization of custom-designed 894.6 nm VCSELs for miniature atomic clocks

• Abstract
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• Optics Express, Vol. 21, Issue 5, pp. 5781-5792 (March 2013)
• F. Gruet, A. Al-Samaneh, E. Kroemer, L. Bimboes, D. Miletic, C. Affolderbach, D. Wahl, R. Boudot, G. Mileti, R. Michalzik

Endless frequency shifting of optical frequency comb lines

• Abstract
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• Optics Express, Vol. 21, Issue 5, pp. 5793-5802 (March 2013)
• Erik Benkler, Felix Rohde, Harald R. Telle

Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection

• Abstract
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• Optics Express, Vol. 21, Issue 7, pp. 8904-8915 (April 2013)
• Aongus McCarthy, Nils J. Krichel, Nathan R. Gemmell, Ximing Ren, Michael G. Tanner, Sander N. Dorenbos, Val Zwiller, Robert H. Hadfield, Gerald S. Buller

Characterization of the transmitted near-infrared wavefront error for the GRAVITY/VLTI Coudé Infrared Adaptive Optics System

• Abstract
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• Optics Express, Vol. 21, Issue 7, pp. 9069-9080 (April 2013)
• Pengqian Yang, Stefan Hippler, Casey P. Deen, Wolfgang Brandner, Yann Clénet, Thomas Henning, Armin Huber, Sarah Kendrew, Rainer Lenzen, Oliver Pfuhl, Jianqiang Zhu

Frequency-comb-referenced multi-wavelength profilometry for largely stepped surfaces

• Abstract
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• Optics Express, Vol. 21, Issue 8, pp. 9780-9791 (April 2013)
• Sangwon Hyun, Minah Choi, Byung Jae Chun, Seungman Kim, Seung-Woo Kim, Young-Jin Kim

Common-path design criteria for laser datum based measurement of small angle deviations and laser autocollimation method in compliance with the criteria with high accuracy and stability

• Abstract
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• Optics Express, Vol. 21, Issue 9, pp. 11391-11403 (May 2013)
• Fan Zhu, Jiubin Tan, Jiwen Cui

Traceable terahertz power measurement from 1 THz to 5 THz

• Abstract
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• Optics Express, Vol. 21, Issue 12, pp. 14466-14473 (June 2013)
• Andreas Steiger, Mathias Kehrt, Christian Monte, Ralf Müller

Sagittal and meridional radii of curvature for a surface with symmetry of revolution by using a null-screen testing method

• Abstract

• Applied Optics, Vol. 52, Issue 4, pp. 625-634 (February 2013)
• Amilcar Estrada-Molina, Manuel Campos-García, Rufino Díaz-Uribe

Influence of tilt on collinear calibration of a laser interferometer

• Abstract

• Applied Optics, Vol. 52, Issue 4, pp. B46-B51 (February 2013)
• Shanzhi Tang, Zhao Wang, Jianmin Gao, Lihong Zhong

Optical coherence tomography-based scanning system for shape determination, wall thickness mapping, and inner inspection of glass containers

• Abstract

• Applied Optics, Vol. 52, Issue 9, pp. 1793-1798 (March 2013)
• Eneas Nicolás Morel, Marina Verónica Gutierrez, Hernán Miguel Miranda, Edgardo Luis Sambrano, Jorge Román Torga

Displacement sensor for indoor machine calibrations

• Abstract

• Applied Optics, Vol. 52, Issue 15, pp. 3461-3472 (May 2013)
• Asloob Ahmad Mudassar, Saira Butt

Profile measurement of glass sheet using multiple wavelength backpropagation interferometry

• Abstract

• Applied Optics, Vol. 52, Issue 16, pp. 3726-3731 (June 2013)
• Samuel Choi, Kohei Otsuki, Osami Sasaki, Takamasa Suzuki