High topographical accuracy by optical shot noise reduction in digital holographic microscopy

• Abstract

• JOSA A, Vol. 29, Issue 4, pp. 498-506 (April 2012)
• Miguel León-Rodríguez, Ramón Rodríguez-Vera, Juan A. Rayas, Sergio Calixto

Full polarization optical profilometry

• Abstract

• JOSA A, Vol. 29, Issue 8, pp. 1508-1515 (August 2012)
• S. Arhab, H. Giovannini, K. Belkebir, G. Soriano

Fiber-optic interferometer fringe projection using integrating bucket modulation

• Abstract

• JOSA A, Vol. 29, Issue 12, pp. 2552-2556 (December 2012)
• Duan Fajie, Lv Changrong, Zhang Chao, Duan Xiaojie, Zhang Fukai

Accurate image quantization adapted to multisource photometric reconstruction for rough textured surface analysis

• Abstract

• JOSA A, Vol. 30, Issue 3, pp. 518-526 (March 2013)
• Alexandre Bony, Benjamin Bringier, Majdi Khoudeir

Single-shot profilometry of rough surfaces using hyperspectral interferometry

• Abstract

• Optics Letters, Vol. 37, Issue 3, pp. 350-352 (February 2012)
• Taufiq Widjanarko, Jonathan M. Huntley, Pablo D. Ruiz

Rapid in-process measurement of surface roughness using adaptive optics

• Abstract

• Optics Letters, Vol. 37, Issue 5, pp. 848-850 (March 2012)
• Yiin Kuen Fuh, Kuo Chan Hsu, Jia Ren Fan

Ultra-high efficiency multilayer blazed gratings through deposition kinetic control

• Abstract

• Optics Letters, Vol. 37, Issue 10, pp. 1628-1630 (May 2012)
• D. L. Voronov, E. H. Anderson, E. M. Gullikson, F. Salmassi, T. Warwick, V. V. Yashchuk, H. A. Padmore

Multiview phase shifting: a full-resolution and high-speed 3D measurement framework for arbitrary shape dynamic objects

• Abstract
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• Optics Letters, Vol. 38, Issue 9, pp. 1389-1391 (May 2013)
• Zhongwei Li, Kai Zhong, Y. F. Li, Xiaohui Zhou, Yusheng Shi

Method of surface topography retrieval by direct solution of sparse weighted seminormal equations

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1714-1726 (January 2012)
• Jeffrey Koskulics, Steven Englehardt, Steven Long, Yongxiang Hu, Knut Stamnes

Two-quadrant area structure function analysis for optical surface characterization

• Abstract
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• Optics Express, Vol. 20, Issue 21, pp. 23275-23280 (October 2012)
• Liangyu He, Chris J. Evans, Angela Davies

Laser divided-aperture differential confocal sensing technology with improved axial resolution

• Abstract
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• Optics Express, Vol. 20, Issue 23, pp. 25979-25989 (November 2012)
• Weiqian Zhao, Chao Liu, Lirong Qiu

Regularized multiframe phase-shifting algorithm for three-dimensional profilometry

• Abstract

• Applied Optics, Vol. 51, Issue 1, pp. 33-42 (January 2012)
• Fuqin Deng, Wui Fung Sze, Jiangwen Deng, Kenneth S. M. Fung, W. H. Leung, Edmund Y. Lam

Improved white-light interferometry on rough surfaces by statistically independent speckle patterns

• Abstract

• Applied Optics, Vol. 51, Issue 6, pp. 751-757 (February 2012)
• Bernhard Wiesner, Ondrej Hybl, Gerd Häusler

Three-dimensional measuring technique for surface topography using a light-sectioning microscope

• Abstract

• Applied Optics, Vol. 51, Issue 8, pp. 1162-1170 (March 2012)
• Linglin Xia, Peifeng Chen, Ying Wang, Le Zhou, Xi Luo

Flexible error-reduction method for shape measurement by temporal phase unwrapping: phase averaging method

• Abstract

• Applied Optics, Vol. 51, Issue 21, pp. 4945-4953 (July 2012)
• Liu Yong, Huang Dingfa, Jiang Yong

Analytical modeling and three-dimensional finite element simulation of line edge roughness in scatterometry

• Abstract

• Applied Optics, Vol. 51, Issue 27, pp. 6457-6464 (September 2012)
• Akiko Kato, Sven Burger, Frank Scholze

Computerized interferometric surface measurements [Invited]

• Abstract

• Applied Optics, Vol. 52, Issue 1, pp. 1-8 (January 2013)
• James C. Wyant

Generating random rough edges, surfaces, and volumes

• Abstract

• Applied Optics, Vol. 52, Issue 7, pp. 1472-1480 (March 2013)
• Chris A. Mack

Suitability of goniospectrophotometric space curves as appearance fingerprints

• Abstract

• Applied Optics, Vol. 52, Issue 12, pp. 2718-2728 (April 2013)
• Marta Klanjšek Gunde, Nina Rogelj

Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensor

• Abstract

• Applied Optics, Vol. 52, Issue 14, pp. 3279-3287 (May 2013)
• Tobias Herffurth, Sven Schröder, Marcus Trost, Angela Duparré, Andreas Tünnermann