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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

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Spectroscopy : Spectroscopy, infrared


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  • Optics Letters, Vol. 39, Issue 19, pp. 5471-5474 (October 2014)
  • I. Znakovskaya, E. Fill, N. Forget, P. Tournois, M. Seidel, O. Pronin, F. Krausz, A. Apolonski

  • Optics Letters, Vol. 39, Issue 20, pp. 5917-5920 (October 2014)
  • Feifei Huang, Xueqiang Liu, Yu Zhang, Lili Hu, Danping Chen

  • Optics Letters, Vol. 39, Issue 21, pp. 6351-6354 (November 2014)
  • Florian Michel, Carsten Juretzka, Mathieu Carras, Wolfgang Elsäßer

  • Optics Letters, Vol. 39, Issue 23, pp. 6561-6564 (December 2014)
  • Jan Kischkat, Mykhaylo P. Semtsiv, Mikaela Elagin, Grygorii Monastyrskyi, Yuri Flores, Sergii Kurlov, Sven Peters, W. Ted Masselink

  • Optics Letters, Vol. 39, Issue 23, pp. 6620-6623 (December 2014)
  • Robin S. M. Chrystie, Ehson F. Nasir, Aamir Farooq

  • Optics Letters, Vol. 39, Issue 24, pp. 6811-6814 (December 2014)
  • Katherine M. Manfred, James M. R. Kirkbride, Luca Ciaffoni, Robert Peverall, Grant A. D. Ritchie

  • Optics Express, Vol. 22, Issue 20, pp. 24466-24477 (October 2014)
  • R. Liu, Y. Zhong, L. Yu, H. Kim, S. Law, J.-M. Zuo, D. Wasserman

  • Optics Express, Vol. 22, Issue 23, pp. 27985-27991 (November 2014)
  • R. Centeno, J. Mandon, S. M. Cristescu, F. J. M. Harren

  • Optics Express, Vol. 22, Issue 23, pp. 28027-28036 (November 2014)
  • Christian Pedersen, Qi Hu, Lasse Høgstedt, Peter Tidemand-Lichtenberg, Jeppe Seidelin Dam

  • Optics Express, Vol. 22, Issue 23, pp. 28353-28362 (November 2014)
  • Jin Hwan Kim, Won Sik Kwon, Hyub Lee, Kyung-Soo Kim, Soohyun Kim

  • Optics Express, Vol. 22, Issue 23, pp. 28459-28466 (November 2014)
  • Xiaoyu Ji, Baigang Zhang, Mahesh Krishnamurthi, John Badding, Venkatraman Gopalan

  • Optics Express, Vol. 22, Issue 24, pp. 29611-29616 (December 2014)
  • Hideto Shirai, Constance Duchesne, Yuji Furutani, Takao Fuji

  • Optics Express, Vol. 22, Issue 26, pp. 32429-32439 (December 2014)
  • Jari Peltola, Markku Vainio, Thomas Fordell, Tuomas Hieta, Mikko Merimaa, Lauri Halonen

  • Optics Express, Vol. 22, Issue 26, pp. 32450-32456 (December 2014)
  • Lei Wang, Wei Cai, Weiwei Luo, Zenghong Ma, Chenglin Du, Xinzheng Zhang, Jingjun Xu

  • Optics Express, Vol. 22, Issue 107, pp. A1810-A1817 (December 2014)
  • R. M. Sullenberger, M. L. Clark, R. R. Kunz, A. C. Samuels, D. K. Emge, M.W. Ellzy, C. M. Wynn

  • Applied Optics, Vol. 53, Issue 28, pp. 6399-6408 (October 2014)
  • Hui Geng, Jian-Guo Liu, Yabai He, Yu-Jun Zhang, Zhen-Yu Xu, Jun Ruan, Lu Yao, Rui-Feng Kan

  • Applied Optics, Vol. 53, Issue 32, pp. 7716-7723 (November 2014)
  • Bing Chen, Yu R. Sun, Ze-Yi Zhou, Jian Chen, An-Wen Liu, Shui-Ming Hu

  • Applied Optics, Vol. 53, Issue 34, pp. 8095-8103 (December 2014)
  • Avishek Guha, Ingmar Schoegl

  • Optical Materials Express, Vol. 4, Issue 10, pp. 2150-2165 (October 2014)
  • Tao Wei, Ying Tian, Cong Tian, Xufeng Jing, Junjie Zhang, Long Zhang, Shiqing Xu

  • Optica, Vol. 1, Issue 4, pp. 250-256 (October 2014)
  • Sheng Liu, Michael B. Sinclair, Thomas S. Mahony, Young Chul Jun, Salvatore Campione, James Ginn, Daniel A. Bender, Joel R. Wendt, Jon F. Ihlefeld, Paul G. Clem, Jeremy B. Wright, Igal Brener
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