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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 13, Iss. 10 — Oct. 1, 1996
  • pp: 2306–2314

Influence of shallow traps on the enhancement of the photorefractive grating amplitude by a high-frequency alternating electric field: a probabilistic analysis

Ivan Biaggio and Gérald Roosen  »View Author Affiliations


JOSA B, Vol. 13, Issue 10, pp. 2306-2314 (1996)
http://dx.doi.org/10.1364/JOSAB.13.002306


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Abstract

We calculate the photorefractive grating amplitude in the presence of a high-frequency applied electric field in terms of the mean-square drift length of the charge carriers. We describe how a shallow-trap level and the related long effective deep-trap recombination time are detrimental to the enhancement produced by a square-wave field. We give expressions for the shallow-trap-induced reduction in the steady-state photorefractive gain as well as for its frequency dependence. The photorefractive gain reaches the same value obtained in the one-level model at low frequencies but falls almost exponentially to a shallow-trap-limited value for higher frequencies. We compare the predictions of our model with other existing models and with experimental data.

© 1996 Optical Society of America

Citation
Ivan Biaggio and Gérald Roosen, "Influence of shallow traps on the enhancement of the photorefractive grating amplitude by a high-frequency alternating electric field: a probabilistic analysis," J. Opt. Soc. Am. B 13, 2306-2314 (1996)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-13-10-2306


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References

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