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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 15, Iss. 10 — Oct. 1, 1998
  • pp: 2620–2625

XUV-laser spectrometer for direct absorption measurements: application to CO in the wavelength range 95–97 nm

P. C. Hinnen, S. Stolte, W. Hogervorst, and W. Ubachs  »View Author Affiliations


JOSA B, Vol. 15, Issue 10, pp. 2620-2625 (1998)
http://dx.doi.org/10.1364/JOSAB.15.002620


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Abstract

A narrowband and tunable XUV-laser source, based on harmonic generation of visible laser light, is developed for sensitive and direct absorption measurements. A novel method to monitor and eliminate the fluctuating intensity of this source is developed, which increases the sensitivity for absorption by an order of magnitude. This procedure allows for accurate relative cross-section measurements, demonstrated on selected bands of CO in the wavelength range 95–97 nm.

© 1998 Optical Society of America

OCIS Codes
(020.4900) Atomic and molecular physics : Oscillator strengths
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(300.1030) Spectroscopy : Absorption
(300.6540) Spectroscopy : Spectroscopy, ultraviolet

Citation
P. C. Hinnen, S. Stolte, W. Hogervorst, and W. Ubachs, "XUV-laser spectrometer for direct absorption measurements: application to CO in the wavelength range 95–97 nm," J. Opt. Soc. Am. B 15, 2620-2625 (1998)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-15-10-2620

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