The dynamic behavior of the complementary space-charge gratings formed in a Bi12SiO20 crystal through prolonged recording at 780 nm is used to determine a number of significant photorefractive parameters, including effective trap density, diffusion length, and dielectric relaxation time, simultaneously for both types of charge carriers. This simple, all-optical method does not require prior knowledge of any other photorefractive parameters and therefore represents the only procedure currently available capable of direct materials evaluation in the low-coupling regime. Furthermore, the scheme provides the means for quantitatively assessing the effects of crystal sensitization resulting, for example, from uniform preillumination.
© 1998 Optical Society of America
[Optical Society of America ]
L. Boutsikaris, S. Mailis, and N. A. Vainos, "Determination of the photorefractive parameters of Bi12SiO20 by study of the dynamic behavior of complementary gratings," J. Opt. Soc. Am. B 15, 1042-1051 (1998)