OSA's Digital Library

Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 15, Iss. 9 — Sep. 1, 1998
  • pp: 2481–2489

Measurement precision in surface Brillouin scattering

P. R. Stoddart, J. C. Crowhurst, A. G. Every, and J. D. Comins  »View Author Affiliations

JOSA B, Vol. 15, Issue 9, pp. 2481-2489 (1998)

View Full Text Article

Acrobat PDF (267 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



A number of explanations have been put forward to account for systematic discrepancies between the results of surface Brillouin scattering spectroscopy and those of ultrasonic measurements. These include the effect of surface imperfections, geometrical aperture effects, and variation in the scattering cross section. We have developed an analytical procedure for correcting the errors associated with the aperture and the cross section, taking into account issues such as sample anisotropy and out-of-plane scattering that were not previously considered. These new computational tools can be applied to ripple scattering for arbitrary polarization from any smooth opaque surface, including films and multilayers. The power of the approach is demonstrated for the case of single-crystal silicon, in which some features of the observed spectra are more accurately predicted. Experimental methods that minimize the errors are also discussed.

© 1998 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(240.0240) Optics at surfaces : Optics at surfaces
(290.0290) Scattering : Scattering
(300.0300) Spectroscopy : Spectroscopy

P. R. Stoddart, J. C. Crowhurst, A. G. Every, and J. D. Comins, "Measurement precision in surface Brillouin scattering," J. Opt. Soc. Am. B 15, 2481-2489 (1998)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. F. Nizzoli and J. R. Sandercock, “Surface Brillouin scattering from phonons,” in Dynamical Properties of Solids, G. K. Horton and A. A. Maradudin, eds. (North-Holland, Amsterdam, 1990), pp. 281–335.
  2. M. Mendik, S. Sathish, A. Kulik, G. Gremaud, and P. Wachter, “Surface acoustic wave studies on single-crystal nickel using Brillouin scattering and scanning acoustic microscopy,” J. Appl. Phys. 71, 2830–2834 (1992).
  3. M. W. Elmiger, “Raman scattering under high pressure in samarium selenide and Brillouin spectroscopy from surface acoustic waves,” Doctoral dissertation (Eidgenössische Technische Hochschule, Zurich, Switzerland, 1988).
  4. P. R. Stoddart, J. D. Comins, and A. G. Every, “Brillouin-scattering measurements of surface-acoustic-wave velocities in silicon at high temperatures,” Phys. Rev. B 51, 17, 574–17, 578 (1995).
  5. J. R. Sandercock, “Light scattering from surface acoustic phonons in metals and semiconductors,” Solid State Commun. 26, 547–551 (1978).
  6. V. R. Velasco and F. Garcia-Moliner, “Brillouin scattering from surface waves,” Solid State Commun. 33, 1–5 (1980).
  7. P. Mutti, C. E. Bottani, G. Ghislotti, M. Beghi, G. A. D. Briggs, and J. R. Sandercock, “Surface Brillouin scattering—extending surface wave measurements to 20 GHz,” in Advances in Acoustic Microscopy, A. Briggs, ed. (Plenum, New York, 1995), Vol. 1, pp. 249–300.
  8. M. Ezz-el-Arab, B. Galperin, J. Brielles, and B. Vodar, “Variation des vitesses de propagation des ultrasons dans le silicium monocrystallin entre 25° et 830 °C,” Solid State Commun. 6, 387–390 (1968).
  9. M. G. Beghi, C. E. Bottani, P. M. Ossi, T. A. Lafford, and B. K. Tanner, “Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films,” J. Appl. Phys. 81, 672–678 (1997); R. Jorna, D. Visser, V. Bortolani, and F. Nizzoli, “Elastic and vibrational properties of nickel films measured by surface Brillouin scattering,” J. Appl. Phys. 65, 718–825 (1989).
  10. R. Loudon and J. R. Sandercock, “Analysis of the light scattering cross section for surface ripples on solids,” J. Phys. C 13, 2609–2622 (1980).
  11. G. S. Agarwal, “Interaction of electromagnetic waves at rough dielectric surfaces,” Phys. Rev. B 15, 2371–2383 (1977).
  12. R. Loudon, “Theory of surface-ripple Brillouin scattering by solids,” Phys. Rev. Lett. 40, 581–583 (1978).
  13. K. R. Subbaswamy and A. A. Maradudin, “Photoelastic and surface-corrugation contributions to Brillouin scattering from an opaque crystal,” Phys. Rev. B 18, 4181–4199 (1978).
  14. V. Bortolani, F. Nizzoli, and G. Santoro, “Surface density of acoustic phonons in GaAs,” Phys. Rev. Lett. 41, 39–42 (1978).
  15. J. A. Bell, R. J. Zanoni, C. T. Seaton, G. I. Stegeman, W. R. Bennet, and C. Falco, “Brillouin scattering from Love waves in Cu/Nb metallic superlattices,” Appl. Phys. Lett. 51, 652–654 (1987).
  16. G. W. Farnell, “Properties of elastic surface waves,” in Physical Acoustics–Principles and Methods, W. P. Mason and R. N. Thurston, eds. (Academic, New York, 1970), Vol. VI, pp. 109–166.
  17. J. O. Kim and R. D. Weglein, “Comment on ‘Surface acoustic wave studies on single crystal nickel using Brillouin scattering and scanning acoustic microscope, ’ ” J. Appl. Phys. 75, 5459–5460 (1994).
  18. M. M. Puentes-Heras and O. Kolosov, Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, England (personal communication, 1997).
  19. A. E. Kadyshevich, V. M. Beilin, Yu. Kh. Vekilov, O. M. Krasil’nikov, and V. N. Podd’yakov, “Investigation of the influence of free current carriers on the elastic constants of germanium and silicon,” Fiz. Tverd. Tela Leningrad 9, 1861–1867 (1967) [Sov. Phys. Solid State 9, 1467–1472 (1968)];R. W. Keyes, “Device implications of the electronic effect in the elastic constants of silicon,” IEEE Trans. Sonics Ultrason. SU-29, 99–103 (1982).
  20. A. G. Eguiluz and A. A. Maradudin, “Frequency shift and attenuation length of a Rayleigh wave due to surface roughness,” Phys. Rev. B 28, 728–747 (1983).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited