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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 16, Iss. 6 — Jun. 1, 1999
  • pp: 1007–1015

Interferometric detection of ultrafast thermoelastic transients in thin films: theory with supporting experiment

C. J. K. Richardson, M. J. Ehrlich, and J. W. Wagner  »View Author Affiliations

JOSA B, Vol. 16, Issue 6, pp. 1007-1015 (1999)

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The thermoelastic generation and interferometric detection of ultrafast thermal and acoustic transients in a 300-nm-thick tungsten film are theoretically predicted and supported through experiment. Detection of these picosecond transients is obtained with a time-resolved spectroscopy scheme that uses a rotated cube, common path, self-stabilized Michelson interferometer and subpicosecond laser pulses from a mode-locked laser. These observations are theoretically described by the superposition of changes in the complex index of refraction and displacements over the absorption volume. Data analysis is completed in both time and frequency domains to support the validity of the classical assumptions involved in the theoretical derivation.

© 1999 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(300.6500) Spectroscopy : Spectroscopy, time-resolved
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties
(310.6870) Thin films : Thin films, other properties
(320.5390) Ultrafast optics : Picosecond phenomena

C. J. K. Richardson, M. J. Ehrlich, and J. W. Wagner, "Interferometric detection of ultrafast thermoelastic transients in thin films:theory with supporting experiment," J. Opt. Soc. Am. B 16, 1007-1015 (1999)

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