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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 19, Iss. 4 — Apr. 1, 2002
  • pp: 656–662

Entangled-photon ellipsometry

Ayman F. Abouraddy, Kimani C. Toussaint, Jr., Alexander V. Sergienko, Bahaa E. A. Saleh, and Malvin C. Teich  »View Author Affiliations

JOSA B, Vol. 19, Issue 4, pp. 656-662 (2002)

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Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute, i.e., they require neither source nor detector calibration, nor do they require a reference.

© 2002 Optical Society of America

OCIS Codes
(000.1600) General : Classical and quantum physics
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(190.0190) Nonlinear optics : Nonlinear optics
(270.0270) Quantum optics : Quantum optics
(350.4600) Other areas of optics : Optical engineering

Ayman F. Abouraddy, Kimani C. Toussaint, Jr., Alexander V. Sergienko, Bahaa E. A. Saleh, and Malvin C. Teich, "Entangled-photon ellipsometry," J. Opt. Soc. Am. B 19, 656-662 (2002)

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