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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 19, Iss. 4 — Apr. 1, 2002
  • pp: 902–910

Characterization of AlGaAs/AlAs waveguides for optical parametric interactions

Giuseppe Leo, Gaetano Assanto, Olivier Durand, and Vincent Berger  »View Author Affiliations

JOSA B, Vol. 19, Issue 4, pp. 902-910 (2002)

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We report on the use of several complementary techniques for the optical characterization of semiconductor waveguides for parametric generation. Grating-assisted distributed coupling, x-ray reflectometry, and surface-emitting second-harmonic generation allowed us to evaluate the effective indices of the guided modes, the thickness of each constituent layer, and the modal birefringences of a multilayer AlGaAs/AlAs waveguide, respectively. With the experimental accuracy afforded by these techniques we could precisely infer the bulk refractive indices of various films to comply with the strict requirements for phase-matched guided-wave devices.

© 2002 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.2790) Integrated optics : Guided waves
(130.5990) Integrated optics : Semiconductors

Giuseppe Leo, Gaetano Assanto, Olivier Durand, and Vincent Berger, "Characterization of AlGaAs/AlAs waveguides for optical parametric interactions," J. Opt. Soc. Am. B 19, 902-910 (2002)

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