Z-scan technique for characterizing third-order optical nonlinearity by use of quasi-one-dimensional slit beams
JOSA B, Vol. 21, Issue 5, pp. 968-972 (2004)
http://dx.doi.org/10.1364/JOSAB.21.000968
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Abstract
We report a theoretical study of the Z-scan technique by using quasi-one-dimensional slit beams for characterizing third-order optical nonlinearity. We verify that the sensitivity of this Z-scan scheme is roughly the same level as top-hat beams and is greatly higher than Gaussian beams by a factor of approximately 2.5. This scheme should have the capability to measure less than a λ/500 wave-front distortion at least. Numerical formulas obtained in theory allow direct estimation of nonlinear refraction and absorption coefficients from the normalized peak–valley transmittance difference measured. Some salient features are also discussed. This Z-scan scheme is also demonstrated experimentally.
© 2004 Optical Society of America
OCIS Codes
(190.3270) Nonlinear optics : Kerr effect
(190.4180) Nonlinear optics : Multiphoton processes
(190.4420) Nonlinear optics : Nonlinear optics, transverse effects in
Citation
Bing Gu, Jun Yan, Qin Wang, Jing-Liang He, and Hui-Tian Wang, "Z-scan technique for characterizing third-order optical nonlinearity by use of quasi-one-dimensional slit beams," J. Opt. Soc. Am. B 21, 968-972 (2004)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-21-5-968
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