The effect of surface roughness on the ellipsometric response of semiconductor surfaces is investigated.
© 2006 Optical Society of America
Original Manuscript: March 6, 2006
Manuscript Accepted: April 27, 2006
Giacomo Badano, Philippe Ballet, Jean-Paul Zanatta, Xavier Baudry, Alain Million, and James W. Garland, "Ellipsometry of rough CdTe(211)B-Ge(211) surfaces grown by molecular beam epitaxy," J. Opt. Soc. Am. B 23, 2089-2096 (2006)