We demonstrate that a negative-permittivity material (silicon carbide) sandwiched between two layers of positive-permittivity material (silicon oxide) can be used for enhancement of the resolution of near-field imaging via the superlensing effect. The resulting three-layer metamaterial is also shown to exhibit an enhanced transmission when its effective dielectric permittivity matches that of the vacuum. Experimental far-field diagnostics of the superlensing based on measuring transmission coefficients through the metal-coated superlens is implemented using Fourier-transformed infrared microscopy. Superlensing is shown to be a highly resonant phenomenon manifested in a narrow frequency range.
© 2006 Optical Society of America
Original Manuscript: July 21, 2005
Manuscript Accepted: August 21, 2005
Vol. 1, Iss. 4 Virtual Journal for Biomedical Optics
Dmitriy Korobkin, Yaroslav Urzhumov, and Gennady Shvets, "Enhanced near-field resolution in midinfrared using metamaterials," J. Opt. Soc. Am. B 23, 468-478 (2006)