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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: G. I. Stegeman
  • Vol. 23, Iss. 9 — Sep. 1, 2006
  • pp: 1954–1964

Ultrafast imaging interferometry at femtosecond-laser-excited surfaces

Vasily V. Temnov, Klaus Sokolowski-Tinten, Ping Zhou, and Dietrich von der Linde  »View Author Affiliations

JOSA B, Vol. 23, Issue 9, pp. 1954-1964 (2006)

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A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces is described. The apparatus is capable of measuring both very small phase shifts ( 3 × 10 2 rad ) and amplitude changes ( 1 % ) with micrometer spatial resolution ( 1 μ m ) . Interferograms are processed using a 2D-Fourier transform algorithm. We discuss the image formation and the physical interpretation of the measured interferograms. The technique is applied to measure transient changes of a GaAs surface irradiated with intense femtosecond laser pulses with fluences near the ablation threshold.

© 2006 Optical Society of America

OCIS Codes
(000.2170) General : Equipment and techniques
(100.2650) Image processing : Fringe analysis
(110.2990) Imaging systems : Image formation theory
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

Original Manuscript: January 6, 2006
Revised Manuscript: April 14, 2006
Manuscript Accepted: April 19, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Vasily V. Temnov, Klaus Sokolowski-Tinten, Ping Zhou, and Dietrich von der Linde, "Ultrafast imaging interferometry at femtosecond-laser-excited surfaces," J. Opt. Soc. Am. B 23, 1954-1964 (2006)

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