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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry M. Van Driel
  • Vol. 24, Iss. 10 — Oct. 1, 2007
  • pp: 2736–2740

Phase-sensitive electric-field-induced second-harmonic microscopy of metal-semiconductor junctions

K. Wu, R. Carriles, and M. C. Downer  »View Author Affiliations


JOSA B, Vol. 24, Issue 10, pp. 2736-2740 (2007)
http://dx.doi.org/10.1364/JOSAB.24.002736


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Abstract

We demonstrate an electric-field-induced second-harmonic microscope that measures both amplitude and phase of imaged second-harmonic light with submicrometer spatial resolution, thus characterizing the electrostatic field variations near metal-semiconductor junctions.

© 2007 Optical Society of America

OCIS Codes
(190.2620) Nonlinear optics : Harmonic generation and mixing
(240.4350) Optics at surfaces : Nonlinear optics at surfaces
(350.5030) Other areas of optics : Phase

ToC Category:
Microscopy

History
Original Manuscript: March 5, 2007
Revised Manuscript: August 6, 2007
Manuscript Accepted: August 24, 2007
Published: September 25, 2007

Virtual Issues
Vol. 2, Iss. 11 Virtual Journal for Biomedical Optics

Citation
K. Wu, R. Carriles, and M. C. Downer, "Phase-sensitive electric-field-induced second-harmonic microscopy of metal-semiconductor junctions," J. Opt. Soc. Am. B 24, 2736-2740 (2007)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-24-10-2736


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References

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