Ellipsometric analysis of the spectral properties and dynamic transitions of photochromic thin films
JOSA B, Vol. 24, Issue 9, pp. 2097-2107 (2007)
http://dx.doi.org/10.1364/JOSAB.24.002097
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Abstract
Solgel phenyl functionalized silica thin films were used as a host matrix to embed photochromic molecules (1,3,3,5,6-pentamethyl-spiro[indoline-2-
© 2007 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(160.6060) Materials : Solgel
(210.4810) Optical data storage : Optical storage-recording materials
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Materials
History
Original Manuscript: December 18, 2006
Revised Manuscript: April 25, 2007
Manuscript Accepted: April 30, 2007
Published: August 3, 2007
Citation
Alberto Alvarez-Herrero, Rosario Pardo, Marcos Zayat, and David Levy, "Ellipsometric analysis of the spectral properties and dynamic transitions of photochromic thin films," J. Opt. Soc. Am. B 24, 2097-2107 (2007)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-24-9-2097
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