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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry M. Van Driel
  • Vol. 24, Iss. 9 — Sep. 1, 2007
  • pp: 2097–2107

Ellipsometric analysis of the spectral properties and dynamic transitions of photochromic thin films

Alberto Alvarez-Herrero, Rosario Pardo, Marcos Zayat, and David Levy  »View Author Affiliations


JOSA B, Vol. 24, Issue 9, pp. 2097-2107 (2007)
http://dx.doi.org/10.1364/JOSAB.24.002097


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Abstract

Solgel phenyl functionalized silica thin films were used as a host matrix to embed photochromic molecules (1,3,3,5,6-pentamethyl-spiro[indoline-2- 3 -[quinolino]oxazine], 3-(2,4-dimethoxyphenyl)-3-(4-methoxyphenyl)- 3 H -naphtho[2,1-b]pyran and 3,3-diphenyl- 3 H -naphtho[2,1-b]pyran). The coatings were doped with individual dyes and mixtures of them. The optical properties of the colored and colorless forms of these photochromic materials were studied using variable angle spectroscopic ellipsometry. Light polarization analyses allowed an exhaustive ellipsometric characterization of these materials. Important changes were obtained in the refractive indices of the colored and colorless samples, with differences of up to 0.012 and 0.018 in the real and imaginary components, respectively. Good correlation was observed on the optical parameters of samples doped with individual dyes and mixtures of them. Standard transmission measurements were used to study the dynamic photochromic transitions and obtain the kinetic constants. The high capabilities of ellipsometry for the high-accuracy characterization of dynamic photochromic transitions were demonstrated. This technique allowed measuring variations in the populations of colored and colorless molecules, resulting from variations of temperature lower than ± 0.1 ° C .

© 2007 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(160.6060) Materials : Solgel
(210.4810) Optical data storage : Optical storage-recording materials
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Materials

History
Original Manuscript: December 18, 2006
Revised Manuscript: April 25, 2007
Manuscript Accepted: April 30, 2007
Published: August 3, 2007

Citation
Alberto Alvarez-Herrero, Rosario Pardo, Marcos Zayat, and David Levy, "Ellipsometric analysis of the spectral properties and dynamic transitions of photochromic thin films," J. Opt. Soc. Am. B 24, 2097-2107 (2007)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-24-9-2097


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