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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry Van Driel
  • Vol. 26, Iss. 10 — Oct. 1, 2009
  • pp: 1892–1896

Accurate measurements of second-order nonlinear optical coefficients of 6H and 4H silicon carbide

Hiroaki Sato, Makoto Abe, Ichiro Shoji, Jun Suda, and Takashi Kondo  »View Author Affiliations


JOSA B, Vol. 26, Issue 10, pp. 1892-1896 (2009)
http://dx.doi.org/10.1364/JOSAB.26.001892


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Abstract

The second-order nonlinear optical coefficients of 4H-SiC and 6H-SiC have been measured by use of two second-harmonic generation methods, the rotational Maker-fringe and wedge techniques, at the fundamental wavelength of 1.064 μ m . Measurements on high-quality (0001) and ( 11 2 ¯ 0 ) plane samples as well as rigorous analyses taking into account the multiple-reflection effects allowed us to accurately determine the magnitudes of the nonlinear optical coefficients. The obtained values are d 31 = 6.7 pm V , d 15 = 6.5 pm V , and d 33 = 12.5 pm V for 6H-SiC; and d 31 = 6.5 pm V , d 15 = 6.7 pm V , and d 33 = 11.7 pm V for 4H-SiC.

© 2009 Optical Society of America

OCIS Codes
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW

ToC Category:
Nonlinear Optics

History
Original Manuscript: June 1, 2009
Revised Manuscript: August 7, 2009
Manuscript Accepted: August 11, 2009
Published: September 15, 2009

Citation
Hiroaki Sato, Makoto Abe, Ichiro Shoji, Jun Suda, and Takashi Kondo, "Accurate measurements of second-order nonlinear optical coefficients of 6H and 4H silicon carbide," J. Opt. Soc. Am. B 26, 1892-1896 (2009)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-26-10-1892

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