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Modes in silver-iodide-lined hollow metallic waveguides mapped by terahertz near-field time-domain microscopy |
JOSA B, Vol. 30, Issue 1, pp. 127-135 (2013)
http://dx.doi.org/10.1364/JOSAB.30.000127
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Abstract
Thin dielectric layers inside hollow metallic waveguides are used to improve the waveguide transmission characteristics as the dominant waveguide mode changes into the hybrid
© 2012 Optical Society of America
OCIS Codes
(320.7100) Ultrafast optics : Ultrafast measurements
(180.4243) Microscopy : Near-field microscopy
(110.6795) Imaging systems : Terahertz imaging
ToC Category:
Microscopy
History
Original Manuscript: August 6, 2012
Revised Manuscript: October 2, 2012
Manuscript Accepted: November 15, 2012
Published: December 12, 2012
Citation
Miguel Navarro-Cia, Carlos M. Bledt, Miriam S. Vitiello, Harvey E. Beere, David A. Ritchie, James A. Harrington, and Oleg Mitrofanov, "Modes in silver-iodide-lined hollow metallic waveguides mapped by terahertz near-field time-domain microscopy," J. Opt. Soc. Am. B 30, 127-135 (2013)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-30-1-127
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