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Design and fabrication of amorphous germanium thin film-based single-material distributed Bragg reflectors operating near 2.2 μm for long wavelength applications |
JOSA B, Vol. 30, Issue 4, pp. 838-842 (2013)
http://dx.doi.org/10.1364/JOSAB.30.000838
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Abstract
We report the design and fabrication of single-material distributed Bragg reflectors (DBRs) composed of amorphous germanium (a-Ge) thin films by a glancing angle deposition and their optical reflectance characteristics in the long wavelength region of 1.7–3.1 μm, together with the aid of theoretical analysis using a rigorous coupled-wave analysis method. The refractive index of the a-Ge films is estimated from the measured transmittance spectra. The high and low refractive indices a-Ge films (i.e.,
© 2013 Optical Society of America
OCIS Codes
(160.4760) Materials : Optical properties
(230.1480) Optical devices : Bragg reflectors
(310.1860) Thin films : Deposition and fabrication
(310.4165) Thin films : Multilayer design
ToC Category:
Optical Devices
History
Original Manuscript: December 11, 2012
Revised Manuscript: February 9, 2013
Manuscript Accepted: February 11, 2013
Published: March 12, 2013
Citation
Jung Woo Leem and Jae Su Yu, "Design and fabrication of amorphous germanium thin film-based single-material distributed Bragg reflectors operating near 2.2 μm for long wavelength applications," J. Opt. Soc. Am. B 30, 838-842 (2013)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-30-4-838
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