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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| JOSA B: OPTICAL PHYSICS

  • Editor: G. I. Stegeman
  • Vol. 23, Iss. 2 — Feb. 1, 2006
  • pp: 318–325

Optics InfoBase > JOSA B > Volume 23 > Issue 2 > Numerical simulations of optical parametric amplification cross-correlation frequency-resolved optical gating

Numerical simulations of optical parametric amplification cross-correlation frequency-resolved optical gating

Xuan Liu, Aparna Prasad Shreenath, Mark Kimmel, Rick Trebino, Arlee V. Smith, and Stephan Link

JOSA B, Vol. 23, Issue 2, pp. 318-325        doi:10.1364/JOSAB.23.000318

» View Full Text: Acrobat PDF (1151 KB)

  • OCIS Codes:
  • (190.4410) Nonlinear optics : Nonlinear optics, parametric processes
  • (190.7110) Nonlinear optics : Ultrafast nonlinear optics
  • (300.6420) Spectroscopy : Spectroscopy, nonlinear
  • (300.6530) Spectroscopy : Spectroscopy, ultrafast
ToC Category:
Nonlinear Optics

Citation
Xuan Liu, Aparna Prasad Shreenath, Mark Kimmel, Rick Trebino, Arlee V. Smith, and Stephan Link, "Numerical simulations of optical parametric amplification cross-correlation frequency-resolved optical gating," J. Opt. Soc. Am. B 23, 318-325 (2006)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-23-2-318

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Abstract

We perform numerical simulations of cross-correlation frequency-resolved optical gating with the nonlinearities, optical parametric amplification, and difference-frequency generation for measuring broadband pulses. We show that use of a noncollinear beam geometry that matches the group velocities of the pump, signal, and idler pulses permits use of relatively thick crystals for high gain without significant distortion in the measured trace, yielding bandwidths of ~100 nm.

© 2006 Optical Society of America

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History
Original Manuscript: April 12, 2005
Manuscript Accepted: August 30, 2005
Revised Manuscript: August 24, 2005

References

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Author Affiliations

Xuan Liu, Aparna Prasad Shreenath, Mark Kimmel, Rick Trebino

Georgia Institute of Technology

Arlee V. Smith

Sandia National Laboratories

Stephan Link

University of Texas at Austin

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