A form of optical second-harmonic microscopy has been developed that spatially resolves concentration gradients of surface adsorbates. Surface concentration profiles at submonolayer levels are illuminated with a pulsed laser, and the reflected second-harmonic light is imaged into a photodiode array. Micrometer-scale resolution is obtainable while the surface damage and the spurious chemistry induced by more conventional electron- or ion-based techniques are avoided. We have used this microscopy to monitor the surface diffusion of Sb on Ge(111).
© 1993 Optical Society of America
Original Manuscript: April 28, 1992
Revised Manuscript: July 28, 1992
Published: March 1, 1993
K. A. Schultz, I. I. Suni, and E. G. Seebauer, "Microscopy of adsorbates by surface second-harmonic generation," J. Opt. Soc. Am. B 10, 546-550 (1993)