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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 13, Iss. 12 — Dec. 1, 1996
  • pp: 2720–2723

Z scan using circularly symmetric beams

Bum Ku Rhee, Jin Seob Byun, and E. W. Van Stryland  »View Author Affiliations


JOSA B, Vol. 13, Issue 12, pp. 2720-2723 (1996)
http://dx.doi.org/10.1364/JOSAB.13.002720


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Abstract

We report general characteristics of on-axis Z-scan transmittance for arbitrary circularly symmetric beams. Some experimental results are presented for a nearly top-hat-shaped beam and for a trimmed Airy beam whose electric field profile is the central portion of an Airy function inside its first zero. The sensitivity of Z-scan method with a trimmed Airy beam for measuring an induced index-of-refraction change is a factor of 1.5 greater than that of a Gaussian beam. Also, it is found that there are some advantages of experimental alignment and numerical convergence for a Z-scan measurement that uses a trimmed Airy beam over one that uses a top-hat beam.

© 1996 Optical Society of America

Citation
Bum Ku Rhee, Jin Seob Byun, and E. W. Van Stryland, "Z scan using circularly symmetric beams," J. Opt. Soc. Am. B 13, 2720-2723 (1996)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-13-12-2720

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