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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 14, Iss. 5 — May. 1, 1997
  • pp: 1138–1148

Measuring optical nonlinearities with a two-beam X-scan technique

John E. La Sala, Kevin Dietrick, Glenn Benecke, Todd Buhr, David Gardner, Corey Gerving, and Adrian Perica  »View Author Affiliations

JOSA B, Vol. 14, Issue 5, pp. 1138-1148 (1997)

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We present a new two-beam technique, the X scan, for measuring both absorptive and refractive components of optical nonlinearities in bulk semiconductors. The sample is excited by a high-intensity, short (picosecond) pump pulse and is probed with weak degenerate or nondegenerate pulses whose relative arrival time and transverse alignment with the pump are varied. X scans at various delays enable separation of free-carrier mediated nonlinearities and instantaneous χ(3) nonlinearities. Varying the relative pump–probe polarizations yields components of the χ(3) tensor. We report new values for degenerate (532 nm) and nondegenerate (532; 683 nm) cross-phase-modulation and two-photon-absorption coefficients for two polarization states and free-carrier absorption and refractive cross sections at 532 and 683 nm.

© 1997 Optical Society of America

John E. La Sala, Kevin Dietrick, Glenn Benecke, Todd Buhr, David Gardner, Corey Gerving, and Adrian Perica, "Measuring optical nonlinearities with a two-beam X-scan technique," J. Opt. Soc. Am. B 14, 1138-1148 (1997)

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  1. M. Sheik-Bahae, J. Wang, R. DeSalvo, D. J. Hagan, and E. W. Van Stryland, “Measurement of nondegenerate nonlinearities using a two-color Z-scan,” Opt. Lett. 17, 260 (1992). [CrossRef]
  2. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760 (1990). [CrossRef]
  3. J. Wang, M. Sheik-Bahae, A. A. Said, D. J. Hagan, and E. W. Van Stryland, “Time-resolved Z-scan measurements of optical nonlinearities,” J. Opt. Soc. Am. B 11, 1009 (1994). [CrossRef]
  4. D. Fournier, A. C. Boccara, W. Jackson, and N. M. Amer, “Sensitive photothermal deflection technique for measuring absorption in optically thin media,” Opt. Lett. 5, 377 (1980). [CrossRef] [PubMed]
  5. W. B. Jackson, N. M. Amer, A. C. Boccara, and D. Fournier, “Photothermal deflection spectroscopy and detection,” Appl. Opt. 20, 1333 (1981). [CrossRef] [PubMed]
  6. M. Bertolotti, A. Ferrari, C. Sibilia, G. Suber, D. Apostol, and P. Jani, “Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses,” Appl. Opt. 27, 1811 (1988). [CrossRef] [PubMed]
  7. K. H. Lee, W. R. Cho, J. H. Park, J. S. Kim, S. H. Park, and U. Kim, “Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser,” Opt. Lett. 19, 1116 (1994). [CrossRef] [PubMed]
  8. J. R. Milward, J. A. K. Kar, C. R. Pidgeon, and B. S. Wherrett, “Photogenerated carrier recombination time in bulk ZnSe,” J. Appl. Phys. 69, 2708 (1991). [CrossRef]
  9. V. L. Vinetskii, N. V. Kukhtarev, and M. S. Soskin, “Transformation of intensities and phases of light beams by a transient ‘undisplaced’ holographic grating,” Sov. J. Quantum Electron. 7, 230 (1977). [CrossRef]
  10. V. L. Vinetskii, N. V. Kukhtarev, E. N. Sal’kova, and L. G. Sukhoverkhova, “Mechanisms of dynamic conversion of coherent optical beams in CdS,” Sov. J. Quantum Electron. 10, 684 (1980). [CrossRef]
  11. G. C. Valley, and A. L. Smirl, “Theory of transient energy transfer in gallium arsenide,” IEEE J. Quantum Electron. 24, 304 (1988). [CrossRef]
  12. A. L. Smirl, J. Dubard, A. G. Cui, T. F. Boggess, and G. C. Valley, “Polarization-rotation switch using picosecond pulses in GaAs,” Opt. Lett. 14, 242 (1989). [CrossRef] [PubMed]
  13. H. E. Ruda, ed., Widegap II–VI Compounds for Opto-electronic Applications (Chapman and Hall, New York, 1992).
  14. K. Seeger, Semiconductor Physics, An Introduction (Springer-Verlag, New York, 1991), p. 356ff.
  15. D. H. Auston, S. McAfee, C. V. Shank, E. P. Ippen, and O. Teschke, “Picosecond Spectroscopy of Semiconductors,” Solid State Electron. 21, 147 (1978). [CrossRef]
  16. R. K. Jain and M. B. Klein, “Degenerate four-wave mixing in semiconductors,” in Optical Phase Conjugation, R. A. Fisher, ed. (Academic, New York, 1983), p. 335.
  17. D. C. Hutchings and E. W. Van Stryland, “Nondegenerate two-photon absorption in zinc blende semiconductors,” J. Opt. Soc. Am. B 9, 2065 (1992). [CrossRef]
  18. A. J. Stentz, M. Kauranen, J. J. Maki, G. P. Agrawal, and R. W. Boyd, “Induced focusing and spatial wave breaking from cross-phase modulation in a self-defocusing medium,” Opt. Lett. 17, 19 (1992). [CrossRef] [PubMed]
  19. R. DeSalvo, M. Sheik-Bahae, A. A. Said, D. J. Hagan, and E. W. Van Stryland, “Z-scan measurements of the anisotropy of nonlinear refraction and absorption in crystals,” Opt. Lett. 18, 194 (1993). [CrossRef] [PubMed]
  20. Y. R. Shen, Principles of Nonlinear Optics (Wiley-Interscience, New York, 1984), p. 51.
  21. R. W. Boyd, Nonlinear Optics (Academic, San Diego, 1992).
  22. J. Feinberg, D. Heiman, A. R. Tanguay, Jr., and R. W. Hellwarth, “Photorefractive effects and light-induced charge migration in barium titanate,” J. Appl. Phys. 51, 1297 (1980). [CrossRef]

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