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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 14, Iss. 5 — May. 1, 1997
  • pp: 1138–1148

Measuring optical nonlinearities with a two-beam X-scan technique

John E. La Sala, Kevin Dietrick, Glenn Benecke, Todd Buhr, David Gardner, Corey Gerving, and Adrian Perica  »View Author Affiliations


JOSA B, Vol. 14, Issue 5, pp. 1138-1148 (1997)
http://dx.doi.org/10.1364/JOSAB.14.001138


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Abstract

We present a new two-beam technique, the X scan, for measuring both absorptive and refractive components of optical nonlinearities in bulk semiconductors. The sample is excited by a high-intensity, short (picosecond) pump pulse and is probed with weak degenerate or nondegenerate pulses whose relative arrival time and transverse alignment with the pump are varied. X scans at various delays enable separation of free-carrier mediated nonlinearities and instantaneous χ(3) nonlinearities. Varying the relative pump–probe polarizations yields components of the χ(3) tensor. We report new values for degenerate (532 nm) and nondegenerate (532; 683 nm) cross-phase-modulation and two-photon-absorption coefficients for two polarization states and free-carrier absorption and refractive cross sections at 532 and 683 nm.

© 1997 Optical Society of America

Citation
John E. La Sala, Kevin Dietrick, Glenn Benecke, Todd Buhr, David Gardner, Corey Gerving, and Adrian Perica, "Measuring optical nonlinearities with a two-beam X-scan technique," J. Opt. Soc. Am. B 14, 1138-1148 (1997)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-14-5-1138

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