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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 15, Iss. 3 — Mar. 1, 1998
  • pp: 1147–1154

High-accuracy universal polarimeter measurement of optical activity and birefringence of α-quartz in the presence of multiple reflections

P. Gomez and C. Hernandez  »View Author Affiliations

JOSA B, Vol. 15, Issue 3, pp. 1147-1154 (1998)

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The high-accuracy universal polarimeter (HAUP) method for simultaneous measurement of birefringence and optical activity in crystals is used when multiple reflections at the plate faces cause modulated variation of the optical parameters. We applied the HAUP method to obtain the birefringence and gyration tensors of α-quartz as a function of temperature in the range 25–100 °C at λ=632.8 nm. Results for birefringence Δn=ne-no and nonnull gyration tensor components g11,g22=g11, and g33, with samples cut in different crystallography planes, are consistent with crystal symmetry and in good agreement with other reported values. For example, the temperature coefficient d(Δn)/dt for a cut perpendicular to the optical axis is -1.06×10-6 (°C)-1,g11=(5.9±0.4)×10-5, and g33=-(10.1±0.2)×10-5 at 24 °C.

© 1998 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(260.1440) Physical optics : Birefringence

P. Gomez and C. Hernandez, "High-accuracy universal polarimeter measurement of optical activity and birefringence of α-quartz in the presence of multiple reflections," J. Opt. Soc. Am. B 15, 1147-1154 (1998)

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  1. J. Kobayashi and Y. Uesu, J. Appl. Crystallogr. 16, 204–211 (1983). [CrossRef]
  2. J. Kobayashi, Y. Uesu, and H. Takehara, J. Appl. Crystallogr. 16, 212–219 (1983). [CrossRef]
  3. J. Kobayashi, H. Kumoni, and K. Saito, J. Appl. Crystallogr. 19, 337–381 (1986). [CrossRef]
  4. J. R. L. Moxon and A. R. Renshaw, J. Phys. Condens. Matter 2, 6807–6836 (1990). [CrossRef]
  5. D. A. Holmes, J. Opt. Soc. Am. 54, 1115–1120 (1964). [CrossRef]
  6. H. Melle, Optik (Stuttgart) 72, 157–164 (1986).
  7. G. D. Landry and T. A. Maldonado, Appl. Opt. 35, 5870–5879 (1996). [CrossRef] [PubMed]
  8. K. Zander, J. Moser, and H. Melle, Optik (Stuttgart) 70, 6–13 (1985).
  9. T. C. Oakberg, Opt. Eng. 34, 1545–1550 (1995). [CrossRef]
  10. G. D. Landry and T. A. Maldonado, J. Opt. Soc. Am. A 13, 1737–1748 (1996). [CrossRef]
  11. A. Yariv and P. Yeh, Optical Waves in Crystals (Wiley, New York, 1984), Chap. 4, pp. 94–103.
  12. J. F. Nye, Physical Properties of Crystals (Oxford U. Press, Oxford, UK, 1985), Chap. 14.
  13. T. A. Maldonado and T. K. Gaylord, Appl. Opt. 28, 2075–2086 (1989). [CrossRef] [PubMed]
  14. A. Miller, Phys. Rev. B 8, 5902–5908 (1973). [CrossRef]
  15. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1989), Chap. 1, p. 27.
  16. Ref. 15, Chap. 1, p. 64.
  17. A. J. Rogers, Proc. R. Soc. London Ser. A 353, 177–192 (1977). [CrossRef]
  18. F. J. Micheli, American Institute of Physics Handbook (McGraw-Hill, New York, 1972), pp. 6–27.
  19. I. I. Vishnevskii, N. L. Kireeva, M. L. Litvin, and Yu. I. Sazonov, Inorg. Mater. 26, 1255–1258 (1990).
  20. J. P. Bachheimer and G. Dolino, Phys. Rev. B 11, 3195–3205 (1974). [CrossRef]
  21. F. A. Modine, R. W. Major, and E. Sonder, Appl. Opt. 14, 757–760 (1975). [CrossRef] [PubMed]
  22. J. Kobayashi, T. Asahi, S. Takahashi, and A. M. Glazer, J. Appl. Crystallogr. 21, 479–484 (1988). [CrossRef]
  23. J. Kobayashi, M. Takada, N. Hosogaya, and T. Someya, Ferroelectr. Lett. Sect. 8, 145–152 (1988). [CrossRef]
  24. H. Horinaka, K. Tomii, H. Sonomura, and T. Miyauchi, Jpn. J. Appl. Phys. 24, 755–760 (1985). [CrossRef]
  25. G. Szivessy and Cl. Munster, Ann. Phys. (Leipzig) 20, 703–726 (1934). [CrossRef]

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