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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 15, Iss. 3 — Mar. 1, 1998
  • pp: 1198–1204

Interpretation of in-plane and out-of-plane anisotropic surface–interface reflectance and transmittance difference spectroscopy

Tat-Kun Kwok, K. C. Tam, and Paul K. Chu  »View Author Affiliations


JOSA B, Vol. 15, Issue 3, pp. 1198-1204 (1998)
http://dx.doi.org/10.1364/JOSAB.15.001198


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Abstract

A numerical method developed previously [J. Appl. Phys. 80, 4621 (1996)] has been extended to simulate the nonnormal-incidence reflectance-difference spectroscopy and transmittance-difference spectroscopy spectra of biaxial anisotropic (xyz) multilayer systems with finite thickness. It is demonstrated that, when the principal axes of the anisotropy layer are at certain orientations, a reflectance-difference spectrum can be separated into two spectra, namely, an in-plane anisotropic spectrum and an out-of-plane anisotropic spectrum. It is shown that the separation is valid for large in-plane anisotropy, i.e., |x-y||x|, and an incident angle of 20°.

© 1998 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.7000) Instrumentation, measurement, and metrology : Transmission
(300.0300) Spectroscopy : Spectroscopy

Citation
Tat-Kun Kwok, K. C. Tam, and Paul K. Chu, "Interpretation of in-plane and out-of-plane anisotropic surface–interface reflectance and transmittance difference spectroscopy," J. Opt. Soc. Am. B 15, 1198-1204 (1998)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-15-3-1198

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