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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 15, Iss. 3 — Mar. 1, 1998
  • pp: 1235–1241

X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plate

T. Wilhein, D. Altenbernd, U. Teubner, E. Förster, R. Hässner, W. Theobald, and R. Sauerbrey  »View Author Affiliations

JOSA B, Vol. 15, Issue 3, pp. 1235-1241 (1998)

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An absolutely calibrated spectrograph based on a new single x-ray optical element, namely, an elliptical off-axis reflection zone plate, has been used for brilliance measurements of a laser-produced plasma of solid carbon and boron nitride. The spectral range investigated, λ2.14.3 nm, covers the emission from excited H- and He-like carbon states to the ground state. The plasma was generated by a subpicosecond high-intensity KrF*-laser pulse at an intensity of 2×1016 W/cm2. Under these conditions more than 1011 photons/sr per pulse were emitted in the strongest lines, demonstrating that this plasma can serve as an intense x-ray source. The measured spectra were in good agreement with a simulation that used the radiation program ration for an electron density of ne=4×1022 cm3 and an electron temperature of Te=90 eV. Measurements of spectral changes at different angles of incidence of the laser beam confirmed theoretical predictions for line intensities.

© 1998 Optical Society of America

OCIS Codes
(300.6560) Spectroscopy : Spectroscopy, x-ray
(320.2250) Ultrafast optics : Femtosecond phenomena
(340.0340) X-ray optics : X-ray optics
(350.5400) Other areas of optics : Plasmas

T. Wilhein, D. Altenbernd, U. Teubner, E. Förster, R. Hässner, W. Theobald, and R. Sauerbrey, "X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plate," J. Opt. Soc. Am. B 15, 1235-1241 (1998)

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