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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 15, Iss. 7 — Jul. 1, 1998
  • pp: 1940–1946

Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration

Vasilii V. Spirin, Changho Lee, and Kwangsoo No  »View Author Affiliations


JOSA B, Vol. 15, Issue 7, pp. 1940-1946 (1998)
http://dx.doi.org/10.1364/JOSAB.15.001940


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Abstract

A two-beam polarization (TBP) interferometer with a reflection configuration for measuring the linear electro-optic coefficient is described and investigated experimentally and theoretically. It is shown that a TBP interferometer can be used for measuring the Pockels coefficient of a thin film with a strong Fabry Perot effect. Relative errors of the simple proposed method for Pockels coefficient measurement are estimated. The TBP interferometer technique is used to measure the effective differential linear electro-optic coefficient r e =r 33 (n o /n e ) 3 r 13 of a lead zirconate titanate thin film. The results are in agreement with known data. 1998 Optical Society of America S0740-3224(98)04507-X

[Optical Society of America ]

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(160.2260) Materials : Ferroelectrics
(310.6860) Thin films : Thin films, optical properties

Citation
Vasilii V. Spirin, Changho Lee, and Kwangsoo No, "Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration," J. Opt. Soc. Am. B 15, 1940-1946 (1998)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-15-7-1940

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